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PDF FI4019HG Data sheet ( Hoja de datos )

Número de pieza FI4019HG
Descripción Digital Audio MOSFET
Fabricantes International Rectifier 
Logotipo International Rectifier Logotipo



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No Preview Available ! FI4019HG Hoja de datos, Descripción, Manual

PD - 96274
IRFI4019HG-117P
DIGITAL AUDIO MOSFET
Features
Ÿ Integrated Half-Bridge Package
Ÿ Reduces the Part Count by Half
Ÿ Facilitates Better PCB Layout
Ÿ Key Parameters Optimized for Class-D
Audio Amplifier Applications
Ÿ Low RDS(ON) for Improved Efficiency
Ÿ Low Qg and Qsw for Better THD and
Improved Efficiency
Ÿ Low Qrr for Better THD and Lower EMI
Ÿ Can Delivery up to 200W per Channel into
8Load in Half-Bridge Configuration
Amplifier
Ÿ Lead-Free Package
Ÿ Halogen-Free
hKey Parameters
VDS
RDS(ON) typ. @ 10V
Qg typ.
Qsw typ.
RG(int) typ.
TJ max
150
80
13
4.1
2.5
150
V
m:
nC
nC
°C
D1
G1
S1/D2
G2
S2
TO-220 Full-Pak 5 PIN
G1, G2
D1, D2
S1, S2
Description
Gate
Drain
Source
This Digital Audio MosFET Half-Bridge is specifically designed for Class D audio amplifier applications. It
consists of two power MosFET switches connected in half-bridge configuration. The latest process is used
to achieve low on-resistance per silicon area. Furthermore, Gate charge, body-diode reverse recovery, and
internal Gate resistance are optimized to improve key Class D audio amplifier performance factors such
as efficiency, THD and EMI. These combine to make this Half-Bridge a highly efficient, robust and reliable
device for Class D audio amplifier applications.
hAbsolute Maximum Ratings
VDS
VGS
ID @ TC = 25°C
ID @ TC = 100°C
IDM
EAS
PD @TC = 25°C
PD @TC = 100°C
Parameter
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
cPulsed Drain Current
dSingle Pulse Avalanche Energy
fPower Dissipation
fPower Dissipation
Max.
150
±20
8.7
6.2
34
77
18
7.2
Units
V
A
mJ
W
Linear Derating Factor
TJ
TSTG
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 seconds
(1.6mm from case)
Mounting torque, 6-32 or M3 screw
hThermal Resistance
0.15
-55 to + 150
300
x x10lb in (1.1N m)
W/°C
°C
Parameter
fRθJC
Junction-to-Case
fRθJA Junction-to-Ambient
Notes  through † are on page 2
www.irf.com
Typ.
–––
–––
Max.
6.9
65
Units
1
10/08/09

1 page




FI4019HG pdf
0.5
ID = 5.2A
0.4
0.3
0.2
0.1
0.0
4
TJ = 125°C
TJ = 25°C
56789
VGS, Gate-to-Source Voltage (V)
10
Fig 12. On-Resistance Vs. Gate Voltage
IRFI4019HG-117P
350
ID
300 TOP 0.91A
1.1A
250 BOTTOM 5.2A
200
150
100
50
0
25
50 75 100 125 150
Starting TJ, Junction Temperature (°C)
Fig 13. Maximum Avalanche Energy Vs. Drain Current
D.U.T +
Driver Gate Drive
P.W.
Period
D=
P.W.
Period
+
‚
-

RG
ƒ Circuit Layout Considerations
Low Stray Inductance
-
Ground Plane
Low Leakage Inductance
Current Transformer
-„ +
*
dv/dt controlled by RG
Driver same type as D.U.T.
VDD
** +
ISD controlled by Duty Factor "D"
-
D.U.T. - Device Under Test
D.U.T. ISD Waveform
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
Body Diode
Inductor Curent
Forward Drop
Ripple 5%
* Use P-Channel Driver for P-Channel Measurements
** Reverse Polarity for P-Channel
*** VGS = 5V for Logic Level Devices
V*G*S*=10V
VDD
ISD
Fig 14. Diode Reverse Recovery Test Circuit for HEXFET® Power MOSFETs
www.irf.com
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