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ADXL311 데이터시트 PDF




Analog Devices에서 제조한 전자 부품 ADXL311은 전자 산업 및 응용 분야에서
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부품번호 ADXL311 기능
기능 Low Cost/ Ultracompact 2 g Dual-Axis Accelerometer
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ADXL311 데이터시트, 핀배열, 회로
FEATURES
Low cost
High resolution
Dual-axis accelerometer on a single IC chip
5 mm × 5 mm × 2 mm CLCC package
Low power < 400 µA (typ)
X-axis and Y-axis aligned to within 0.1° (typ)
BW adjustment with a single capacitor
Single-supply operation
High shock survival
APPLICATIONS
Tilt and motion sensing in cost-sensitive applications
Smart handheld devices
Computer security
Input devices
Pedometers and activity monitors
Game controllers
Toys and entertainment products
Low Cost, Ultracompact
±2 g Dual-Axis Accelerometer
ADXL311
GENERAL DESCRIPTION
The ADXL311 is a low cost, low power, complete dual-axis
accelerometer with signal conditioned voltage outputs, all on a
single monolithic IC. The ADXL311 is built using the same
proven iMEMS® process used in over 100 million Analog
Devices accelerometers shipped to date, with demonstrated
1 FIT reliability (1 failure per 1 billion device operating hours).
The ADXL311 will measure acceleration with a full-scale
range of ±2 g. The ADXL311 can measure both dynamic
acceleration (e.g., vibration) and static acceleration (e.g.,
gravity). The outputs are analog voltages proportional to
acceleration.
The typical noise floor is 300 µg/Hz allowing signals below
2 mg (0.1° of inclination) to be resolved in tilt sensing appli-
cations using narrow bandwidths (10 Hz).
The user selects the bandwidth of the accelerometer using
capacitors CX and CY at the XFILT and YFILT pins. Bandwidths
of 1 Hz to 2 kHz may be selected to suit the application.
The ADXL311 is available in a 5 mm × 5 mm × 2 mm
8-terminal hermetic CLCC package
CDC
3.0V
VDD
CX
XOUT
X SENSOR
DEMOD
RFILT
32k
OSCILLATOR
ADXL311JE
Y SENSOR
DEMOD
32k
RFILT
COM
YOUT
CY
SELF TEST
BIAS
200k
Figure 1. Functional Block Diagram
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703 © 2003 Analog Devices, Inc. All rights reserved.




ADXL311 pdf, 반도체, 판매, 대치품
ADXL311
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Acceleration
(Any Axis, Unpowered)
Acceleration
(Any Axis, Powered, VDD = 3 V)
VDD
Output Short-Circuit Duration,
(Any Pin to Commom)
Operating Temperature Range
Storage Temperature
Rating
3,500 g, 0.5 ms
3,500 g, 0.5 ms
–0.3 V to +0.6 V
Indefinite
–55°C to +125°C
–65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at these or any
other conditions above those indicated in the operational sec-
tion of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 3. Package Characteristics
Package Type
8-Lead CLCC
θJA
120°C/W
θJC
TBD°C/W
Device Weight
<1.0 gram
Rev. A | Page 4 of 12

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ADXL311 전자부품, 판매, 대치품
ADXL311
THEORY OF OPERATION
The ADXL311 is a complete, dual-axis acceleration measure-
ment system on a single monolithic IC. It contains a polysilicon
surface-micromachined sensor and signal conditioning cir-
cuitry to implement an open-loop acceleration measurement
architecture. The output signals are analog voltage proportional
to acceleration. The ADXL311 is capable of measuring both
positive and negative accelerations to at least ±2 g. The acceler-
ometer can measure static acceleration forces, such as gravity,
allowing it to be used as a tilt sensor.
The sensor is a surface-micromachined polysilicon structure
built on top of the silicon wafer. Polysilicon springs suspend the
structure over the surface of the wafer and provide a resistance
against acceleration forces. Deflection of the structure is meas-
ured using a differential capacitor that consists of independent
fixed plates and central plates attached to the moving mass. The
fixed plates are driven by 180° out of phase square waves. Accel-
eration will deflect the beam and unbalance the differential
capacitor, resulting in an output square wave whose amplitude is
proportional to acceleration. Phase sensitive demodulation
techniques are then used to rectify the signal and determine the
direction of the acceleration.
The output of the demodulator is amplified and brought off-
chip through a 32 kΩ resistor. At this point, the user can set the
signal bandwidth of the device by adding a capacitor. This
filtering improves measurement resolution and helps prevent
aliasing.
Applications
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 µF capacitor, CDC, will ade-
quately decouple the accelerometer from noise on the power
supply. However, in some cases, particularly where noise is pre-
sent at the 100 kHz internal clock frequency (or any harmonic
thereof), noise on the supply may cause interference on the
ADXL311 output. If additional decoupling is needed, a 100 Ω
(or smaller) resistor or ferrite beads may be inserted in the sup-
ply line of the ADXL311. Additionally, a larger bulk bypass
capacitor (in the 1 µF to 4.7 µF range) may be added in parallel
to CDC.
SETTING THE BANDWIDTH USING CX AND CY
The ADXL311 has provisions for bandlimiting the XOUT and
YOUT pins. Capacitors must be added at these pins to implement
low-pass filtering for antialiasing and noise reduction. The
equation for the 3 dB bandwidth is
( ( ) )F–3dB = 1/ 2π 32 kΩ ×C(X,Y )
or, more simply
F–3dB = 5 µF/C(X,Y )
The tolerance of the internal resistor (RFILT) can vary typically as
much as ±15% of its nominal value of 32 kΩ; thus, the band-
width will vary accordingly. A minimum capacitance of 1000 pF
for CX and CY is required in all cases.
Table 4. Filter Capacitor Selection, CX and CY
Bandwidth
Capacitor (µF)
10 Hz
0.47
50 Hz
0.10
100 Hz
0.05
200 Hz
0.027
500 Hz
0.01
5 kHz
0.001
SELF TEST
The ST pin controls the self-test feature. When this pin is set to
VDD, an electrostatic force is exerted on the beam of the acceler-
ometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output will be 270 mg (corresponding to 45 mV). This pin may
be left open circuit or connected to common in normal use.
RBIAS SELECTION
A bias resistor (RBIAS) must always be used. If no resistor is pre-
sent, the ADXL311 may appear to work but will suffer degraded
noise performance. The value of the resistor used is not critical.
Any value from 50 kΩ to 2 MΩ can be used. Using a 2 MΩ
resistor rather than a 50 kΩ will save roughly 25 µA of supply
current.
Design Trade-Offs for Selecting Filter
Characteristics: The Noise/BW Trade-Off
The accelerometer bandwidth selected will ultimately determine
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at XOUT and YOUT.
The output of the ADXL311 has a typical bandwidth of 5 kHz.
The user must filter the signal at this point to limit aliasing
errors. The analog bandwidth must be no more than half the
A/D sampling frequency to minimize aliasing. The analog
bandwidth may be further decreased to reduce noise and
improve resolution.
The ADXL311 noise has the characteristics of white Gaussian
noise that contributes equally at all frequencies and is described
in terms of µg/√Hz, i.e., the noise is proportional to the square
Rev. A | Page 7 of 12

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