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PDF AD1380 Data sheet ( Hoja de datos )
| Número de pieza | AD1380 | |
| Descripción | Low Cost 16-Bit Sampling ADC | |
| Fabricantes | Analog Devices | |
| Logotipo |  |
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FEATURES
Complete sampling 16-bit ADC with reference and clock
50 kHz throughput
±1/2 LSB nonlinearity
Low noise SHA: 300 μV p-p
32-lead hermetic DIP
Parallel output
Low power: 900 μW
APPLICATIONS
Medical and analytical instrumentation
Signal processing
Data acquisition systems
Professional audio
Automatic test equipment (ATE)
Telecommunications
GENERAL DESCRIPTION
The AD1380 is a complete, low cost 16-bit analog-to-digital
converter, including internal reference, clock and sample/hold
amplifier. Internal thin-film-on-silicon scaling resistors allow
analog input ranges of ±2.5 V, ±5 V, ±10 V, 0 V to +5 V and
0 V to +10 V.
Important performance characteristics of the AD1380 include
maximum linearity error of ±0.003% of FSR (AD1380KD) and
maximum 16-bit conversion time of 14 μs. Transfer
characteristics of the AD1380 (gain, offset and linearity) are
specified for the combined ADC/sample-and-hold amplifier
(SHA), so total performance is guaranteed as a system. The
AD1380 provides data in parallel with corresponding clock and
status outputs. All digital inputs and outputs are TTL or 5 V
CMOS-compatible.
The serial output function is no longer available after date
code 0120.
Low Cost
16-Bit Sampling ADC
AD1380
FUNCTIONAL BLOCK DIAGRAM
S/H +10V +20V
COMPARATOR GAIN
OUT SPAN SPAN BIPOLAR
IN
ADJ
32 6
7
4
53
AD1380
24 MSB
S/H IN 31
+5V 29
SAMPLE
AND
HOLD
REF
ADC
23 BIT 2
10 BIT 15
DIGITAL 30
COMMON
+15V 2
ANALOG 8
COMMON
TIMING CIRCUITRY
9 LSB
25 NC
27 BUSY
–15V 1
28
START
CONVERT
26
CLOCK
OUT
NC = NO CONNECT
Figure 1.
Rev. D
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113 © 2005 Analog Devices, Inc. All rights reserved.
1 page  
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Rating
Supply Voltage
Logic Supply Voltage
±18 V
+7 V
Analog Ground to Digital Ground
±0.3 V
Analog Inputs (Pin 6, Pin 7, Pin 31)
Digital Input
Output Short-Circuit Duration to
Ground
Sample/Hold
Data
Junction Temperature
Storage Temperature
±VS
−0.3 V to VDD + 0.3 V
Indefinite
1 sec for any one output
175°C
−65°C to +150°C
Lead Temperature (Soldering, 10 sec) 300°C
AD1380
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. D | Page 5 of 12
5 Page 
AD1380
APPLICATIONS
High performance sampling analog-to-digital converters like
the AD1380 require dynamic characterization to ensure that
they meet or exceed their desired performance parameters for
signal processing applications. Key dynamic parameters include
signal-to-noise ratio (SNR) and total harmonic distortion
(THD), which are characterized using Fast Fourier Transform
(FFT) analysis techniques.
The results of that characterization are shown in Figure 11. In
the test, a 13.2 kHz sine wave is applied as the analog input (fO)
at a level of 10 dB below full scale; the AD1380 is operated at a
word rate of 50 kHz (its maximum sampling frequency). The
results of a 1024-point FFT demonstrate the exceptional
performance of the converter, particularly in terms of low noise
and harmonic distortion.
In Figure 11, the vertical scale is based on a full-scale input
referenced as 0 dB. In this way, all (frequency) energy cells can be
calculated with respect to full-scale rms inputs. The resulting
signal-to-noise ratio is 83.2 dB, which corresponds to a noise floor
of −93.2 dB. Total harmonic distortion is calculated by adding the
rms energy of the first four harmonics and equals –97.5 dB.
0
FUNDAMENTAL = 13232
–10 SAMPLE RATE = 50000
SIGNAL (dB) = –10.0
–20 NOISE (dB) = –93.2
THD
(dB) = –97.5
–30
–40
–50
–60
–70
–80
–90
–100
2f (dB) = –100.9
3f (dB) = –101.8
4f (dB) = –111.9
–110
–120
1 44 86 129 171 214 257 299 342 384 427 469 512
FREQUENCY (×48.8281Hz)
Figure 11. FFT of 13.2 kHz Input Signal at −10 dB with a 50 kHz Sample Rate
0
FUNDAMENTAL = 13232
–10 SAMPLE RATE = 50000
SIGNAL (dB) = –0.4
–20 NOISE (dB) = –91.0
THD
(dB) = –80.6
–30
–40
–50
–60
–70
–80
–90
–100
2f (dB) = –80.7
3f (dB) = –99.9
4f (dB) = –102.9
–110
–120
1
44 86 129 171 214 257 299 342 384 427 469 512
FREQUENCY (×48.8281Hz)
Figure 12. FFT of 13.2 kHz Input Signal at −0.4 dB with a 50 kHz Sample Rate
Increasing the input signal amplitude to –0.4 dB of full scale
causes THD to increase to –80.6 dB as shown in Figure 12.
At lower input frequencies, however, THD performance is
improved. Figure 13 shows a full-scale (−0.3 dB) input signal at
1.41 kHz. THD is now −96.0 dB.
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
1
FUNDAMENTAL = 1416
SAMPLE RATE = 50000
SIGNAL (dB) = –0.3
NOISE (dB) = –91.9
THD
(dB) = –96.0
2f (dB) = –97.8
3f (dB) = –102.8
4f (dB) = –106.9
44 86 129 171 214 257 299 342 384 427 469 512
FREQUENCY (×48.8281Hz)
20V SPAN
Figure 13. FFT of 1.4 kHz Input Signal at −0.3 dB with a 50 kHz Sample Rate
The ultimate noise floor can be seen with low level input signals
of any frequency. In Figure 14, the noise floor is at −94 dB, as
demonstrated with an input signal of 24 kHz at −39.8 dB.
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
1
FUNDAMENTAL = 23975
SAMPLE RATE = 50000
SIGNAL (dB) = –39.8
NOISE (dB) = –94.3
THD
(dB) = –107.9
2f (dB) = –116.0
3f (dB) = –113.6
4f (dB) = –112.4
44 86 129 171 214 257 299 342 384 427 469 512
FREQUENCY (×48.8281Hz)
20V SPAN
Figure 14. FFT of 24 kHz Input Signal at −39.8 dB with a 50 kHz Sample Rate
Rev. D | Page 11 of 12
11 Page | ||
| Páginas | Total 12 Páginas | |
| PDF Descargar | [ Datasheet AD1380.PDF ] | |
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