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HS-3530RH 데이터시트 PDF




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부품번호 HS-3530RH 기능
기능 Low Power/ Radiation Hardened Programmable Operational Amplifier
제조업체 Intersil Corporation
로고 Intersil Corporation 로고


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HS-3530RH 데이터시트, 핀배열, 회로
HS-3530RH
August 1995
Low Power, Radiation Hardened
Programmable Operational Amplifier
Features
Pinout
• Radiation Environment
- Neutron Fluence (Φ) 5 x 1012 n/cm2 (E 10KeV)
- Gamma Rate (γ) 1 x 109 RAD (Si)/s
- Gamma Dose (γ) 1 x 106 RAD (Si)
• Wide Range AC Programming
- Slew Rate 0.06 to 3V/µs
- Gain X Bandwidth 100kHz to 5.0MHz
• Wide Range DC Programming
- Power Supply Range ±3.0V to ±15V
• Supply Current 10µA to 1.2mA
• Dielectrically Isolated Device Islands
8 LEAD METAL CAN PACKAGE (CAN)
MIL-STD-1835 MACY1-X8
TOP VIEW
OFFSET
NULL
1
INVERTING
INPUT
2
ISET
8
7 V+
6 OUTPUT
NON-INVERTING 3
5 OFFSET
INPUT
4
NULL
V-
• Short Circuit Protection
Description
NOTE:
1. Case tied to V-.
The HS-3530RH is a Low Power Operational Amplifier which
is an internally compensated monolithic device offering a
wide range of performance specifications. Parameters such
as power dissipation, slew rate, bandwidth, noise and input
DC parameters are programmed by selecting an external
resistor or current source. Supply voltages as low as ±3V
may be used with little degradation of AC performance. The
HS-3530RH has been specifically designed to meet
exposure to space radiation environments. Operation from -55oC
to +125oC is guaranteed.
A major advantage of the HS-3530RH is that operating
characteristics remain virtually constant over a wide supply
range (±3V to ±15V), allowing the amplifier to offer maximum
performance in almost any system, including battery
operated equipment. A primary application for this device is
in active filtering and conditioning for a wide variety of
signals that differ in frequency and amplitude. Also, by
modulating the set current, it can be used for designs such
as current controlled oscillators/modulators, sample and
hold circuits and variable active filters.
Functional Diagram
+V
OFFSET
NULL 2
7
2
-IN
+IN 3
5
6
8
1
4
ISET
OUT
-V OFFSET
NULL 1
Ordering Information
PART NUMBER
HS2-3530RH-8
HS2-3530RH-Q
HS2-3530RH/SAMPLE
TEMPERATURE
RANGE
PACKAGE
-55oC to +125oC 8 Lead Metal Can
-55oC to +125oC 8 Lead Metal Can
+25oC
8 Lead Metal Can
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
762
Spec Number 518079
File Number 3024.2




HS-3530RH pdf, 반도체, 판매, 대치품
Specifications HS-3530RH
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: CL = 100pF, AVCL = +1, RL = 75k, Unless Otherwise Specified.
PARAMETER SYMBOL
CONDITIONS
VSUPPLY = ±15V
Slew Rate +SR VOUT = -10V to +10V
Note 1
-SR VOUT = +10V to -10V
Rise & Fall Time TR
VOUT = 0 to +400mV
10% < TR < 90%
TF VOUT = 0 to -400mV
10% < TF < 90%
Overshoot
+OS
VOUT = 0 to +400mV
-OS VOUT = 0 to -400mV
GROUP A
ISET = 1.5µA
SUBGROUP TEMPERATURE MIN MAX
9
+25oC
0.025 -
9
+25oC
0.025 -
9
+25oC
- 8.0
9
+25oC
- 8.0
9
+25oC
- 35
9
+25oC
- 35
VSUPPLY = ±3V
Slew Rate
Note 1
+SR
-SR
VOUT = -2V to +2V
VOUT = +2V to -2V
9
+25oC
0.01 -
9
+25oC
0.01 -
ISET = 15µA
MIN MAX
0.25 -
0.25 -
- 0.8
- 0.8
- 35
- 35
0.1 -
0.1 -
UNITS
V/µs
V/µs
µs
µs
%
%
V/µs
V/µs
TABLE 3. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: RSOURCE = 50, CL = 100pF, AVCL = +1, Unless Otherwise Specified.
ISET = 1.5µA ISET = 15µA
PARAMETER
SYMBOL
CONDITIONS
NOTES TEMPERATURE MIN MAX MIN MAX UNITS
VSUPPLY = ±15V
Differential Input
Resistance
Full Power Bandwidth
Minimum Closed
Loop Stable Gain
Output Resistance
Quiescent Power
Consumption
Output Short-Circuit
Current
Gain Bandwidth
Product
RIN
FPBW
CLSG
ROUT
PC
IOSC
GBWP
VCM = 0V
VPEAK = 10V
RL = 2k, CL = 50pF
Open Loop
VOUT = 0V, IOUT = 0mA
VOUT = 0V
AVCL = 10V/V
VO = 200mV, fO = 10kHz
1
+25oC
50 - 50 -
1, 2
+25oC
0.4 - 4 -
1 -55oC to +125oC +1 - +1 -
1
+25oC
- 10 - 10
1, 3 -55oC to +125oC - 4.8 - 4.8
1, 4
+25oC
-14 38 -27 42
1
+25oC
45 - 750 -
M
kHz
V/V
mW
mA
kHz
VSUPPLY = ±3V
Gain Bandwidth
Product
GBWP AVCL = 10V/V
VO = 200mV, fO = 10kHz
1
+25oC
30 - 600 - kHz
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK).
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs).
4. Caution: Continuous long-duration short-circuit operation may degrade the operating life of the device.
Spec Number 518079
765

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HS-3530RH 전자부품, 판매, 대치품
HS-3530RH
Intersil Space Level Product Flow -8
GAMMA Radiation Verification (Each Wafer) Method 1019,
4 Samples/Wafer, 0 Rejects
100% Static Burn-In, Condition A or B, 160 Hours, +125oC
or Equivalent, Method 1015
Periodic- Wire Bond Pull Monitor, Method 2011
100% Interim Electrical Test
Periodic- Die Shear Monitor, Method 2019 or 2027
100% PDA, Method 5004 (Note 1)
100% Internal Visual Inspection, Method 2010, Condition B 100% Final Electrical Test
100% Temperature Cycle, Method 1010, Condition C,
10 Cycles
100% Constant Acceleration, Method 2001, Condition per
Method 5004
100% External Visual
100% Initial Electrical Test
100% Fine/Gross Leak, Method 1014
100% External Visual, Method 2009
Sample - Group A, Method 5005 (Note 2)
Sample - Group B, Method 5005 (Note 3)
Sample - Group C, Method 5005 (Notes 3 and 4)
Sample - Group D, Method 5005 (Notes 3 and 4)
100% Data Package Generation (Note 4)
NOTES:
1. Failures from subgroup 1 are used for calculating PDA. The maximum allowable PDA = 5%.
2. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
3. Group B, C and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include
separate line items for Group B test, Group B samples, Group C test and Group C samples and Group D test and Group D samples.
4. Group C and/or D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required,
the P.O. should include a separate line item for Group C generic data and/or D generic data. Generic data is not guaranteed to be avail-
able and is therefore not available in all cases.
5. Data Package Contents:
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quan-
tity).
• GAMMA Radiation Report. Contains Cover page, disposition, RAD Dose, Lot Number, Test Package used, Specification Numbers, Test
equipment, etc. Radiation Read and Record data on file at Intersil.
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Group B, C and D attributes and/or Generic data is included when required by the P.O.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
by an authorized Quality Representative.
Spec Number 518079
768

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부품번호상세설명 및 기능제조사
HS-3530RH

Low Power/ Radiation Hardened Programmable Operational Amplifier

Intersil Corporation
Intersil Corporation

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