|
|
|
부품번호 | 100304F 기능 |
|
|
기능 | Low Power Quint AND/NAND Gate | ||
제조업체 | National Semiconductor | ||
로고 | |||
전체 8 페이지수
August 1998
100304
Low Power Quint AND/NAND Gate
General Description
The 100304 is monolithic quint AND/NAND gate. The Func-
tion output is the wire-NOR of all five AND gate outputs. All
inputs have 50 kΩ pull-down resistors.
Features
n Low Power Operation
n 2000V ESD protection
n Pin/function compatible with 100104
n Voltage compensated operating range = −4.2V to −5.7V
n Available to industrial grade temperature range
n Available to Standard Microcircuit Drawing
(SMD) 5962-9153701
Logic Symbol
DS100304-1
Logic Equation
F = (D1a • D2a) + (D1b • D2b) + D1c • D2c) + (D1d • D2d) + (D1e • D2e).
Pin Names
Dna– Dne
F
Oa– Oe
Oa– Oe
Description
Data Inputs
Function Output
Data Outputs
Complementary Data Outputs
© 1998 National Semiconductor Corporation DS100304
www.national.com
AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
Min Max
TC = +25˚C
Min Max
TC = +125˚C Units Conditions
Min Max
Notes
tPLH Propagation Delay
0.30 1.90 0.40 1.80 0.30 2.30 ns
tPHL
Dna–Dne to O, O
(Notes 7, 8, 9)
tPLH Propagation Delay
0.80 2.90 0.90 2.80 0.90 3.40 ns Figures 1, 2
tPHL
Data to F
tTLH Transition Time
0.20 1.80 0.30 1.60 0.20 2.00 ns
(Note 10)
tTHL 20% to 80%, 80% to 20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Test Circuitry
Notes:
VCC, VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 50Ω to GND
CL = Fixture and stray capacitance ≤ 3 pF
DS100304-5
FIGURE 1. AC Test Circuit
www.national.com
4
4페이지 Physical Dimensions inches (millimeters) unless otherwise noted
24-Pin Ceramic Dual-In-Line Package (D)
NS Package Number J24E
24-Pin Quad Cerpak (F)
NS Package Number W24B
7
www.national.com
7페이지 | |||
구 성 | 총 8 페이지수 | ||
다운로드 | [ 100304F.PDF 데이터시트 ] |
당사 플랫폼은 키워드, 제품 이름 또는 부품 번호를 사용하여 검색할 수 있는 |
구매 문의 | 일반 IC 문의 : 샘플 및 소량 구매 ----------------------------------------------------------------------- IGBT, TR 모듈, SCR 및 다이오드 모듈을 포함한 광범위한 전력 반도체를 판매합니다. 전력 반도체 전문업체 상호 : 아이지 인터내셔날 사이트 방문 : [ 홈페이지 ] [ 블로그 1 ] [ 블로그 2 ] |
부품번호 | 상세설명 및 기능 | 제조사 |
100304 | Low Power Quint AND/NAND Gate | National Semiconductor |
100304 | Low Power Quint AND/NAND Gate | Fairchild Semiconductor |
DataSheet.kr | 2020 | 연락처 | 링크모음 | 검색 | 사이트맵 |