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PDF HY628100BLT1 Data sheet ( Hoja de datos )

Número de pieza HY628100BLT1
Descripción 128K x8 bit 5.0V Low Power CMOS slow SRAM
Fabricantes Hynix Semiconductor 
Logotipo Hynix Semiconductor Logotipo



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Document Title
128K x8 bit 5.0V Low Power CMOS slow SRAM
Revision History
Revision No History
10 Initial Revision History Insert
11 Marking Information Add
Revised
- E.T (-25~85°C), I.T (-40~85°C) Part Insert
- AC Test Condition Add : 5pF Test Load
12 Changed Logo
- HYUNDAI -> hynix
- Marking Information Change
HY628100B Series
128Kx8bit CMOS SRAM
Draft Date
Jul.14.2000
Remark
Final
Dec.04.2000 Final
Apr.30.2001 Final
This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility
for use of circuits described. No patent licenses are implied.
Rev 12 / Apr.2001
Hynix Semiconductor

1 page




HY628100BLT1 pdf
HY628100B Series
AC CHARACTERISTICS
Vcc = 4.5V~5.5V, TA = 0°C to 70°C / -25°C to 85°C (E) / -40¡ Éto 85¡ É(I), unless otherwise specified
# Symbol
Parameter
-55 -70 -85
Min. Max. Min. Max. Min Max.
READ CYCLE
1 tRC Read Cycle Time
55 - 70 - 85 -
2 tAA* Address Access Time
- 55 - 70 - 85
3 tACS* Chip Select Access Time
- 55 - 70 - 85
4 tOE Output Enable to Output Valid
- 25 - 35 - 45
5 tCLZ Chip Select to Output in Low Z
10 - 10 - 10 -
6 tOLZ Output Enable to Output in Low Z
5-5-5-
7 tCHZ Chip Deselection to Output in High Z
0 20 0 25 0 30
8 tOHZ Out Disable to Output in High Z
0 20 0 25 0 30
9 tOH Output Hold from Address Change
10 - 10 - 10 -
WRITE CYCLE
10 tWC Write Cycle Time
55 - 70 - 85 -
11 tCW Chip Selection to End of Write
45 - 60 - 70 -
12 tAW Address Valid to End of Write
45 - 60 - 70 -
13 tAS
Address Set-up Time
0-0-0-
14 tWP Write Pulse Width
40 - 50 - 55 -
15 tWR Write Recovery Time
0-0-0-
16 tWHZ Write to Output in High Z
0 20 0 25 0 30
17 tDW Data to Write Time Overlap
25 - 30 - 40 -
18 tDH Data Hold from Write Time
0-0-0-
19 tOW Output Active from End of Write
5-5-5-
Comment : tAA* and tACS* can meet 50ns with 30pF test load.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
AC TEST CONDITIONS
TA = 0°C to 70°C / -25°C to 85°C (E) / -40¡ Éto 85¡ É(I), unless otherwise specified
Parameter
Value
Input Pulse Level
0.4V to 2.2V
Input Rise and Fall Time
5ns
Input and Output Timing Reference Level
1.5V
Output Load
tCLZ,tOLZ,tCHZ,tOHZ,tWHZ,tOW
CL = 5pF + 1TTL Load
Others
CL = 100pF + 1TTL Load
CL* = 30pF + 1TTL Load
Comment
* : Test load is 30pF for 50ns
AC TEST LOADS
TTL
CL(1)
Note : Including jig and scope capacitance
Rev 12 / Apr.2001
4

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