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PDF 74ACTQ153SC Data sheet ( Hoja de datos )
| Número de pieza | 74ACTQ153SC | |
| Descripción | Quiet Series Dual 4-Input Multiplexer | |
| Fabricantes | Fairchild Semiconductor | |
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July 1990
Revised May 1999
74ACTQ153
Quiet Series Dual 4-Input Multiplexer
General Description
The ACTQ153 is a high-speed dual 4-input multiplexer with
common select inputs and individual enable inputs for each
section. It can select two lines of data from four sources.
The two buffered outputs present data in the true (non-
inverted) form. In addition to multiplexer operation, the
ACTQ153 can act as a function generator and generate
any two functions of three variables.
Features
s Outputs source/sink 24 mA
s ACTQ153 has TTL-compatible inputs
s Guaranteed simultaneous switching noise level and
dynamic threshold performance
s Guaranteed pin-to-pin skew AC performance
s Improved latch-up immunity
Ordering Code:
Order Number Package Number
Package Description
74ACTQ153SC
M20B
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74ACTQ153PC
N20A
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
Pin Descriptions
Pin Names
I0a - 13a
I0b - 13b
S0, S1
Ea
Eb
Za
Zb
Description
Side A Data Inputs
Side B Data Inputs
Common Select Inputs
Side A Enable Input
Side B Enable Input
Side A Output
Side B Output
FACT™, FACT Quiet Series™, and GTO™ are trademarks of Fairchild Semiconductor Corporation.
© 1999 Fairchild Semiconductor Corporation DS010244.prf
www.fairchildsemi.com
1 page  
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500Ω.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
VOLP/VOLV and VOHP/VOHV:
• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50Ω coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
• Measure VOLP and VOLV on the quiet output during the
worst case transition for active and enable. Measure
VOHP and VOHV on the quiet output during the worst
case active and enable transition.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
VILD and VIHD:
• Monitor one of the switching outputs using a 50Ω coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
• First increase the input LOW voltage level, VIL, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds VIL limits, or on output HIGH levels that
exceed VIH limits. The input LOW voltage level at which
oscillation occurs is defined as VILD.
• Next decrease the input HIGH voltage level, VIH, until
the output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds VIL limits, or on output HIGH levels that
exceed VIH limits. The input HIGH voltage level at which
oscillation occurs is defined as VIHD.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
Note 8: VOHV and VOLP are measured with respect to ground reference.
Note 9: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns,
tf = 3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
FIGURE 2. Simultaneous Switching Test Circuit
5 www.fairchildsemi.com
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