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부품번호 | 74F175AN 기능 |
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기능 | Quad D flip-flop | ||
제조업체 | NXP Semiconductors | ||
로고 | |||
전체 10 페이지수
INTEGRATED CIRCUITS
74F175*, 74F175A
Quad D flip-flop
* Discontinued part. Please see the Discontinued Product List in Section 1, page 21.
Product specification
IC15 Data Handbook
1996 Mar 12
Philips
Semiconductors
Philips Semiconductors
Quad D flip-flop
Product specification
74F175A
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free air temperature range
Commercial range
Industrial range
LIMITS
UNIT
MIN
NOM
MAX
4.5 5.0 5.5 V
2.0 V
0.8 V
–18 mA
–1 mA
20 mA
0 +70 °C
–40 +85 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN TYP2 MAX
VOH High-level output voltage
VCC= MIN, VIL = MAX,
VIH = MIN, IOH = MAX
"10%VCC
"5%VCC
2.5
2.7 3.4
V
VOL Low-level output voltage
VCC = MIN, VIL = MAX,
VIH = MIN, IOL = MAX
"10%VCC
"5%VCC
0.30 0.5
0.30 0.5
V
VIK Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100 µA
IIH High-level input current
VCC = MAX, VI = 2.7V
20 µA
IIL Low-level input current
IOS Short-circuit output current3
VCC = MAX, VI = 0.5V
VCC = MAX
74F175A
–60
–20
–150
µA
mA
ICC Supply current (total)
VCC = MAX
74F175A
22 31 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS FOR 74F175A
SYMBOL
PARAMETER
fmax
Maximum clock
frequency
tPLH Propagation delay
tPHL CP to Qn or Qn
tPLH Propagation delay
tPHL
MR to Qn
tPHL Propagation delay
tPHL
MR to Qn
TEST
CONDITION
Waveform 1
Waveform 1
Waveform 3
Tamb = 25°C
VCC = +5V
CL = 50pF,
RL = 500Ω
MIN TYP MAX
140 160
3.0 4.0 6.5
4.5 6.0 8.5
4.5 6.5 9.0
Waveform 3 4.5 6.0 8.0
LIMITS
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF,
RL = 500Ω
MIN MAX
Tamb = *40°C to +85°C
VCC = +5.0V ± 10%
CL = 50pF,
RL = 500Ω
MIN MAX
UNIT
125 110 MHz
2.5 7.5
4.0 9.0
2.5
4.0
8.0
10.0
ns
4.5 10.0
4.5
11.0 ns
4.0 9.0 4.0 10.0 ns
1996 Mar 12
4
4페이지 Philips Semiconductors
Quad D flip-flop
DIP16: plastic dual in-line package; 16 leads (300 mil)
Product specification
74F175*, 74F175A
SOT38-4
* Discontinued part. Please see the Discontinued Product List.
1996 Mar 12
7
7페이지 | |||
구 성 | 총 10 페이지수 | ||
다운로드 | [ 74F175AN.PDF 데이터시트 ] |
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부품번호 | 상세설명 및 기능 | 제조사 |
74F175A | Quad D flip-flop | NXP Semiconductors |
74F175AD | Quad D flip-flop | NXP Semiconductors |
DataSheet.kr | 2020 | 연락처 | 링크모음 | 검색 | 사이트맵 |