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부품번호 | LCP3121 기능 |
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기능 | OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE | ||
제조업체 | ST Microelectronics | ||
로고 | |||
전체 6 페이지수
® LCP3121
Application Specific Discretes
A.S.D.™
OVERVOLTAGE AND OVERCURRENT
PROTECTION FOR TELECOM LINE
FEATURES AND BENEFITS
s UNIDIRECTIONAL OVERVOLTAGE SUP-
PRESSOR PROGRAMMABLE BY VOLTAGE
AND CURRENT:
s PROGRAMMABLE BREAKDOWN VOLTAGE
UP TO 100 V.
s PROGRAMMABLE CURRENT LIMITATION
FROM 120 mA TO 600 mA.
s MULTI-LINE PROTECTION MODE : ONE DE-
VICE CAN PROTECT SEVERAL LINES.
)s HIGH SURGE CURRENT CAPABILITY :
t(sIPP = 100A for 10/1000 µs.
DESCRIPTION
ucDedicated to the protection of sensitive telecom
dequipment, the LCP3121 provides protection
rowhich can be programmed by both voltage and
Pcurrent.
teThe breakdown voltage can be easily programmed
by using an external zener diode.
leThe protection function programmed by the
ocurrent is achieved with the use of a resistor
bsbetween the gate and the cathode. The value of
the resistor will determine the level of the desired
Ocurrent before the triggering of the device.
) -A multiple protection mode is also performed when
t(susing several diodes providing each line interface
with an optimized protection level.
ucIf desired, a bidirectional protection function can
dbe achieved by the use of two LCP3121.
roCOMPLIES WITH THE FOLLOWING STANDARDS :
PCCITT K20 :
leteVDE 0433 :
soVDE 0878 :
ObFCC part 68 :
10/700µs
5/310µs
10/700µs
5/310µs
1.2/50µs
1/20µs
2/10µs
6kV
150A
2kV
50A
1.5kV
40A
2.5kV
SO-8
PIN-OUT CONFIGURATION
C1
8C
Gn 2
7A
Gp 3
6A
C4
5C
All cathod pins must be externally connected
FUNCTIONAL DIAGRAM
A
Gp
BELLCORE
2/10µs
200A (*)
Gn
TR-NWT-001089 : 2/10µs
2.5kV
2/10µs
200A (*)
BELLCORE
TR-NWT-000974 : 10/1000µs 1kV
10/1000µs 100A
(*) with series resistors or PTC.
C
TM: ASD is trademarks of STMicroelectronics.
April 2003 - Ed: 4
1/6
LCP3121
FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST
R
VBAT = -48 V
D.U.T
-VP
Surge
generator
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
t(s)TEST PROCEDURE :
c- Adjust the current level at the IH value by short circuiting the D.U.T.
u- Fire the D.U.T. with a surge current : IPP = 10A, 10/1000µs.
d- The D.U.T. will come back to the off-state within a duration of 50ms max.
bsolete ProFig. 1: Maximum non repetitive surge
Opeak-on-state current versus overload duration.
Fig. 2: Relative variation of holding current versus
junction temperature (typical values).
t(s) -ITSM (A)
c20
u18
d16
ro14
P12
te10
8
le6
o4
bs2
O0
F=50Hz
Tj initial = 25°c
IH [Tj] / IH [Tj=25°C]
1.4
1.2
1.0
0.8
0.6
0.4
0.2
t(s) Tj(°C)
0.0
0.01 0.10
1
10
100
1000
-40 -20 0 20 40 60 80 100 120
4/6
4페이지 | |||
구 성 | 총 6 페이지수 | ||
다운로드 | [ LCP3121.PDF 데이터시트 ] |
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구매 문의 | 일반 IC 문의 : 샘플 및 소량 구매 ----------------------------------------------------------------------- IGBT, TR 모듈, SCR 및 다이오드 모듈을 포함한 광범위한 전력 반도체를 판매합니다. 전력 반도체 전문업체 상호 : 아이지 인터내셔날 사이트 방문 : [ 홈페이지 ] [ 블로그 1 ] [ 블로그 2 ] |
부품번호 | 상세설명 및 기능 | 제조사 |
LCP3121 | OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE | ST Microelectronics |
DataSheet.kr | 2020 | 연락처 | 링크모음 | 검색 | 사이트맵 |