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M74HC4011B1R 데이터시트 PDF




ST Microelectronics에서 제조한 전자 부품 M74HC4011B1R은 전자 산업 및 응용 분야에서
광범위하게 사용되는 반도체 소자입니다.


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부품번호 M74HC4011B1R 기능
기능 BCD TO 7 SEGMENT LATCH/DECODER DRIVER
제조업체 ST Microelectronics
로고 ST Microelectronics 로고


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M74HC4011B1R 데이터시트, 핀배열, 회로
M54HC4511
M74HC4511
BCD TO 7 SEGMENT LATCH/DECODER DRIVER
. HIGH SPEED
tPD = 28 ns (TYP.) AT VCC = 5 V
. LOW POWER DISSIPATION
ICC = 4 µA (MAX.) AT TA = 25 °C
. HIGH NOISE IMMUNITY
VNIH = VNIL = 28 % VCC (MIN.)
. OUTPUT DRIVE CAPABILITY
10 LSTTL LOADS
. HIGH SOURGE CURRENT
|IOH| = 20 mA (MIN.)
. BALANCED PROPAGATION DELAYS
tPLH = tPHL
. WIDE OPERATING VOLTAGE RANGE
VCC (OPR) = 2 V TO 6 V
. PIN AND FUNCTION COMPATIBLE
WITH 4511B
B1R
(Plastic Package)
F1R
(Ceramic Package)
M 1R
(Micro Package)
C1R
(Chip Carrier)
ORDER CODES :
M54HC4011F1R M74HC4011M1R
M74HC4011B1R M74HC4011C1R
DESCRIPTION
The M54/74HC4511 is a high speed CMOS BCD-
TO-7 SEGMENT LATCH/DECODER/DRIVER fab-
ricated with silicon gate C2MOS technology. It
enables high speed latch and decode operation with
identical pin connection and function to standard
CMOS 4511B.
The segment output driver, which is CMOS fabri-
cated in silicon gate C2MOS technology, has large
IOH capability which enables common cathode Leds
to be directly driven.
When lamp test (LT) is taken ”L”, all segment out-
puts will go to ”H”, and when blanking (BI) is taken
”L” and LT is taken ”H” all segment outputs will go
to ”L”.
These functions operate regardless of other inputs
and are used to test the display.
Input BI is used to pulse-modulate the brightness of
the display.
When an error input code (over 10) is applied to the
BCD input, all segment outputs will go ”L” (turn off).
All inputs are equipped with protection circuits
against static discharge and transient excess volt-
age.
February 1993
PIN CONNECTIONS (top view)
NC =
No Internal
Connection
1/13




M74HC4011B1R pdf, 반도체, 판매, 대치품
M54/M74HC4511
INPUT AND OUTPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN No
3
4
5
7, 1, 2, 6
13, 12, 11,
10, 9 , 15,
14
8
16
SYMBOL
LT
BI
LE
A to D
a to g
GND
VCC
NAME AND FUNCTION
Lamp Test Input (Active
LOW)
Ripple Blanking Input
(Active LOW)
Latch Enable Input
BCD Address Inputs
Segment Outputs
Ground (0V)
Positive Supply Voltage
IEC LOGIC SYMBOL
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC Supply Voltage
-0.5 to +7
V
VI DC Input Voltage
-0.5 to VCC + 0.5
V
VO DC Output Voltage
-0.5 to VCC + 0.5
V
IIK DC Input Diode Current
± 20 mA
IOK DC Output Diode Current
± 20 mA
IO DC Output Source Sink Current Per Output Pin
-35/25
mA
ICC or IGND DC VCC or Ground Current
+150/-50
mA
PD Power Dissipation
500 (*)
mW
Tstg Storage Temperature
TL Lead Temperature (10 sec)
-65 to +150
300
oC
oC
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition isnotimplied.
(*) 500 mW: 65 oC derate to 300 mW by 10mW/oC: 65 oC to 85 oC
4/13

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M74HC4011B1R 전자부품, 판매, 대치품
M 54/ M74H C4511
SWITCHING CHARACTERISTICS TEST WAVEFORM
Data Segment Delay Time
LE-Segment Delay Time
BI-Segment Delay Time
Data Set-up/Hold Time
LT-Segment Delay Time
7/13

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관련 데이터시트

부품번호상세설명 및 기능제조사
M74HC4011B1R

BCD TO 7 SEGMENT LATCH/DECODER DRIVER

ST Microelectronics
ST Microelectronics

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