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PDF 89C51ED2 Data sheet ( Hoja de datos )

Número de pieza 89C51ED2
Descripción AT89C51ED2
Fabricantes ATMEL Corporation 
Logotipo ATMEL Corporation Logotipo



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No Preview Available ! 89C51ED2 Hoja de datos, Descripción, Manual

AT89C51RD2 / AT89C51ED2 QualPack
Qualification Package
AT89C51ED2
FLASH 8-bit C51 Microcontroller
64 Kbytes FLASH, 2 Kbytes EEPROM
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AT89C51RD2 / AT89C51ED2
JULY 2003
Rev. 0 – 2003 July
1

1 page




89C51ED2 pdf
3.2 Product Design
Die Size
Pad Size Opening / Pitch
Logic Effective Channel Length
Gate Poly Width (min.)
Gate Poly Spacing (min.)
wwwM.DeattaalS1heeWt4iUd.tchom
Metal 1 Spacing
Metal 2 Width
Metal 2 Spacing
Metal 3 Width
Metal 3 Spacing
Contact Size
Contact Spacing
Via 1 Size
Via 2 Size
AT89C51RD2 / AT89C51ED2 QualPack
17,9 mm2
66 um * 66 um / 111 um
0.35 µm
0.35 µm
0.42 µm
0.42 µm
0.49 µm
0.56 µm
0.49 µm
0.56 µm
0.49 µm
0.35 µm
0.42 µm
0.42 µm
0.42 µm
Rev. 0 – 2003 July
5

5 Page





89C51ED2 arduino
AT89C51RD2 / AT89C51ED2 QualPack
4.3.2 Hot Carriers Injection
Test conditions
The test is performed by forcing a high drain bias on the test device (Vds>Vddmax) to accelerate the carriers to the
maximum. At the same time the gate bias (Vgs) is chosen in order to maximize the injection of carriers into the
gate oxide and also the substrate. WLR_B n-channel W/L 0.35um/25um the stress is performed on a number of
transistors, each at a different stress condition Vds,stress and Vgs,stress. For each transistor, the time to reach the
failure criteria (dIdsat/Idsat=10%) is obtained. NMOS is more sensitive to hot carriers compared to PMOS.
Consequently NMOS is the only structure tested.
Measurement
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AT568T7 lot 1J0433 has been measured using the WLR_B hot electron structure with standard drain.
NMOS W/L = 25/0.35 um.
Results
HCI 56.8k 1J0433 AT568T7 FAB 5 N-Channel W/L 0.35/25.0um
10% Change in Idsat
1
0,1
0,01
y = 5E+16x30,692
R2 = 0,9719
0,001
0,0001
0,2
0,22
0,24 0,26
1/Vdd
0,28
0,3
Conclusion
The extrapolated life time in the worst case conditions (@Vds=Vdd max & Vgs set to maximize substrate current) is
much greater than 0.2 years in DC mode (qualification requirement) which is equivalent to more than 10 years in
AC mode.
Rev. 0 – 2003 July
11

11 Page







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