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5962-90899 데이터시트 PDF




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기능 EEPROM / NOR FLASH / 128K X 8
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5962-90899 데이터시트, 핀배열, 회로
LTR
REVISIONS
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A Updated boilerplate. Added device types 09 - 13. Moved endurance
94-03-25
and data retention testing requirements from Section 4 of drawing to
Section 3 of drawing. Editorial changes throughout.
B Updated boilerplate. Added vendor CAGE 01295 as a source of
supply. Editorial changes throughout. - glg
98-04-16
C Changed standoff width on "U" package. Added vendor CAGE
0EU86 as a source of supply. - glg
99-11-16
M. A. Frye
Raymond Monnin
Raymond Monnin
REV
SHEET
REV
CCCCCCCCCC
SHEET
15 16 17 18 19 20 21 22 23 24
REV STATUS
OF SHEETS
REV
SHEET
CCCCCCCCCCCCC C
1 2 3 4 5 6 7 8 9 10 11 12 13 14
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
PREPARED BY
Gary L. Gross
CHECKED BY
Ray Monnin
APPROVED BY
Michael A. Frye
DRAWING APPROVAL DATE
92-08-31
AMSC N/A
REVISION LEVEL
C
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
MICROCIRCUIT, MEMORY, DIGITAL, CMOS
128K X 8 BIT FLASH EEPROM, MONOLITHIC SILICON
SIZE
A
CAGE CODE
67268
SHEET
1
OF
5962-90899
24
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
5962-E050-00




5962-90899 pdf, 반도체, 판매, 대치품
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-973 - Configuration Management.
MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMD's).
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094).
2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein.
Unless otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DODISS
cited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DODISS are the issues of the
documents cited in the solicitation.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
ASTM Standard F1192-95 - Standard Guide for the Measurement of Single Event Phenomena from
Heavy Ion Irradiation of Semiconductor Devices.
(Applications for copies of ASTM publications should be addressed to the American Society for Testing and Materials,
1916 Race Street, Philadelphia, PA 19103).
ELECTRONICS INDUSTRIES ASSOCIATION (EIA)
JEDEC Standard EIA/JESD78 - IC Latch-Up Test.
(Applications for copies should be addressed to the Electronics Industries Alliance, 2500 Wilson Blvd., Arlington, VA 22201.)
(Non-Government standards and other publications are normally available from the organizations that prepare or distribute
the documents. These documents also may be available in or through libraries or other informational services).
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the
text of this drawing shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations
unless a specific exemption has been obtained.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90899
SHEET
4

4페이지










5962-90899 전자부품, 판매, 대치품
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions
Group A Device
Limits
Units
u-n5l5e4s.5Cs VothTeCVrCwiCs+e12s5p5.e5CcVifi1e/d
Subgroups type
Min
Max
DC CHARACTERISTICS - Continued
VPP erase current
Low level input
voltage
IPP3
VIL
VPP = VPPH erasure in progress 1, 2, 3
1, 2, 3
All 30 2/ mA
All -0.5 2/ 0.8
V
High level input
voltage (TTL)
VIH1
1, 2, 3 All 2.0 VC2/C+ 0.5 V
High level input
voltage (CMOS)
VIH2
1, 2, 3
All 0.7 VCC VC2/C+ 0.5 V
Low level output
voltage
VOL
IOL = 2.1 mA, VCC = VCC min
1, 2, 3
All
0.45
V
High level output
voltage (TTL)
VOH1 IOH = -2.5 mA, VCC = VCC min 1, 2, 3 All 2.4
V
High level output
voltage (CMOS)
VOH2
VOH3
IOH = -2.5 mA, VCC = VCC min
IOH = -100 µA, VCC = VCC min
1, 2, 3
All 0.85 VCC
V2C/C- 0.4
V
V
A9 auto select
voltage
VID A9 = VID
1, 2, 3
All
11.5
13.0
V
A9 auto select
current
IID A9 = VID max, VCC = VCC max 1, 2, 3 All
500 2/ µA
VPP during read
only operations
VPPL
VoPpPerdautrioinngsread/write VPPH
NOTE: erase/program are
inhibited when VPP = VPPL
1, 2, 3
1, 2, 3
All 0 VCC+ 2.0 V
2/
All
11.4
12.6
V
Functional tests
See 4.4.1d
7, 8A, 8B All
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90899
SHEET
7

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5962-90899

EEPROM / NOR FLASH / 128K X 8

Austin Semiconductor
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5962-90899

Stand Microcircuit Drawing Source Approval Bulletin

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