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PDF 5962-86716 Data sheet ( Hoja de datos )

Número de pieza 5962-86716
Descripción ANALOG SWITCH
Fabricantes Intersil　
Logotipo Intersil Logotipo



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No Preview Available ! 5962-86716 Hoja de datos, Descripción, Manual

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
A Add two vendors, CAGE 24355 and CAGE 17856. Add device type 02. Make
changes to 1.2.1, 1.3, 1.4, and table I, figure 1, and figure 3. Editorial changes
throughout.
B Remove vendor, CAGE 24355 from device types 01 and 02. Add device type 03.
Table I changes. Editorial changes throughout.
89-11-09
93-03-02
C Update boilerplate to add class V. –rrp
00-09-07
D Update to current requirements. Editorial changes throughout. - drw
03-05-01
APPROVED
M. A. Frye
M. A. Frye
R. Monnin
Raymond Monnin
heet4U.comREV
SSHEET
taREV
SHEET
aREV STATUS
REV
DDDDDDDDDDDDD
OF SHEETS
SHEET
1 2 3 4 5 6 7 8 9 10 11 12 13
.DPMIC N/A
PREPARED BY
wSTANDARD
wMICROCIRCUIT
mDRAWING
Rick Officer
CHECKED BY
Charles E. Besore
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
w .coTHIS DRAWING IS AVAILABLE
FOR USE BY ALL
UDEPARTMENTS
t4AND AGENCIES OF THE
eeDEPARTMENT OF DEFENSE
APPROVED BY
Michael A. Frye
DRAWING APPROVAL DATE
87-01-30
MICROCIRCUIT, LINEAR, CMOS, HIGH SPEED
QUAD SPST ANALOG SWITCH, MONOLITHIC
SILICON
taShAMSC N/A
REVISION LEVEL
D
SIZE
A
CAGE CODE
67268
5962-86716
aSHEET
.DDSCC FORM 2233
wAPR 97
wwDISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF 13
5962-E370-03

1 page




5962-86716 pdf
TABLE I. Electrical performance characteristics.
Test
Analog signal range
ON resistance
Source OFF leakage
current
Drain OFF leakage
current
Channel ON leakage
current
Low level input voltage
3/
High level input voltage
3/
Input leakage current
(low)
Symbol
Conditions
-55°C ≤ TA ≤+125°C
V+ = +15 V dc, V- = -15 V dc
unless otherwise specified
VS
RDS(ON)
IS(OFF)
TA = +25°C 2/
VS = ±10 V, ID = 1 mA,
VIN = 0.8 V
VS = ±14 V, VD = ±14 V,
VIN = 2.4 V
VD = ±14 V, VS = ±14 V,
VIN = 2.4 V
ID(OFF)
VS = ±14 V, VD = ±14 V,
VIN = 2.4 V
VD = ±14 V, VS = ±14 V,
VIN = 2.4 V
ID(ON)
VD = VS = ±14 V,
VIN = 0.8 V
VIL
Group A
subgroups
4
1
2, 3
1
2, 3
1
2, 3
1
2, 3
1
2, 3
1
2, 3
1
2, 3
7, 8
Device
type
All
All
01
02, 03
02
03
01
02, 03
02
03
01
02, 03
02
03
All
Limits 1/
Min Max
±15
50
75
±10
±100
±1
±100
±60
±10
±100
±1
±100
±60
±10
±100
±1
±100
±60
0.8
Unit
V
Ω
nA
nA
nA
V
VIH
IIL VIN under test = 0.8 V,
All other VIN = 4.0 V
VIN under test = 0 V,
All other VIN = 2.0 V
VIN under test = 1.0 V,
All other VIN = 16.5 V,
VS = ±17 V
7, 8
1, 2, 3
1
2, 3
1, 2, 3
01, 03
02
01
2.4
2.0
02
03
V
±500 µA
±1
±10
±1
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
D
5962-86716
SHEET
5

5 Page





5962-86716 arduino
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-
PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not
affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance
with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on
all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with
method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1015.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device
manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document
revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein except where option 2 of
MIL-PRF-38535 permits alternate in-line control testing. Quality conformance inspection for device class M shall be in accordance
with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified
in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
D
5962-86716
SHEET
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