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PDF ISPPAC-POWR1220AT8 Data sheet ( Hoja de datos )

Número de pieza ISPPAC-POWR1220AT8
Descripción In-System Programmable Power Supply
Fabricantes Lattice Semiconductor 
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No Preview Available ! ISPPAC-POWR1220AT8 Hoja de datos, Descripción, Manual

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ispPAC-® POWR1220AT8
October 2005
In-System Programmable Power Supply
Monitoring, Sequencing and Margining Controller
Preliminary Data Sheet
Features
Application Block Diagram
Monitor, Control, and Margin Multiple
Power Supplies
• Simultaneously monitors up to 12 power
Primary
Supply
3.3V
supplies
• Provides up to 20 output control signals
• Provides up to eight analog outputs for
margining/trimming power supply voltages
• Programmable digital and analog circuitry
Primary
Supply
Primary
Supply
2.5V
1.8V
Power Supply Margin and Trim Functions
• Trim and margin up to eight power supplies
• Dynamic voltage control through I2C
Primary
Supply
POL#1
• Four hardware selectable voltage profiles
• Independent Digital Closed-Loop Trim function
for each output
Embedded PLD for Sequence Control
• 48-macrocell CPLD implements both state
machines and combinatorial logic functions
Primary
Supply
POL#N
8 Analog
Trim
Outputs
Other Control/Supervisory
Signals
16 Digital
Outputs
4 MOSFET
Drivers
Embedded Programmable Timers
• Four independent timers
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• 32µs to 2 second intervals for timing sequences
Power Supply
Margin/Trim
Control Block
ADC
Analog Input Monitoring
• 12 independent analog monitor inputs
4 Timers
ispPAC-POWR1220AT8
CPLD
48 Macrocells
83 Inputs
6 Digital
Inputs
I2C
Interface
I2C
Bus
CPU
• Differential inputs for remote ground sense
• Two programmable threshold comparators per
analog input
• Hardware window comparison
• 10-bit ADC for I2C monitoring
High-Voltage FET Drivers
• Power supply ramp up/down control
• Programmable current and voltage output
• Independently configurable for FET control or
digital output
2-Wire (I2C/SMBus™ Compatible) Interface
Description
Lattice’s Power Manager II ispPAC-POWR1220AT8 is a
general-purpose power-supply monitor, sequence and
margin controller, incorporating both in-system pro-
grammable logic and in-system programmable analog
functions implemented in non-volatile E2CMOS® tech-
nology. The ispPAC-POWR1220AT8 device provides 12
independent analog input channels to monitor up to 12
power supply test points. Each of these input channels
offers a differential input to support remote ground
• Comparator status monitor
sensing, and has two independently programmable
• ADC readout
comparators to support both high/low and in-bounds/
• Direct control of inputs and outputs
out-of-bounds (window-compare) monitor functions. Six
• Power sequence control
general-purpose digital inputs are also provided for mis-
• Dynamic trimming/margining control
cellaneous control functions.
3.3V Operation, Wide Supply Range 2.8V to
3.96V
• In-system programmable through JTAG
• Industrial temperature range: -40°C to +85°C
• 100-pin TQFP package, lead-free option
The ispPAC-POWR1220AT8 provides 20 open-drain
digital outputs that can be used for controlling DC-DC
converters, low-drop-out regulators (LDOs) and opto-
couplers, as well as for supervisory and general-pur-
pose logic interface functions. Four of these outputs
DataShee
© 2005 Lattice Semiconductor Corp. All Lattice trademarks, registered trademarks, patents, and disclaimers are as listed at www.latticesemi.com/legal. All other
DataSheet4Ubra.cndoomr product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without
notice.
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1220at8_01.0
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ISPPAC-POWR1220AT8 pdf
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ispPAC-POWR1220AT8 Data Sheet
et4U.com
Pin Descriptions (Cont.)
Number
Name
Pin Type
Voltage Range
Description
73 TRIM8
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 8
91 RESETb9 Digital I/O
Device Reset (Active Low)
95 PLDCLK Digital Output
250kHz PLD Clock Output (Tristate), CMOS
Output
96 MCLK
Digital I/O
8MHz Clock I/O (Tristate), CMOS Drive
34 TDO
Digital Output
JTAG Test Data Out
37 TCK
Digital Input
JTAG Test Clock Input
28 TMS
Digital Input
JTAG Test Mode Select
31 TDI
Digital Input
JTAG Test Data In, TDISEL pin = 1
30 ATDI
Digital Input
JTAG Test Data In (Alternate), TDISEL Pin = 0
32 TDISEL
Digital Input
Select TDI/ATDI Input
92 SCL
Digital Input
I2C Serial Clock Input
93 SDA
Digital I/O
I2C Serial Data, Bi-directional Pin
44, 59 RESERVED
Reserved - Do Not Connect
26, 27, 29,
35, 41, 49,
76, 77, 78,
NC
81, 99, 100
No Internal Connection
1. [IN1...IN6] are inputs to the PLD. The thresholds for these pins are referenced by the voltage on VCCINP.
2. IN1 pin can also be controlled through JTAG interface.
3. [IN2..IN6] can also be controlled through I2C/SMBus inteDrfaactea.Sheet4U.com
4. The VMON inputs can be biased independently from VCCA.
5. The VMONGS inputs are the ground sense line for each given VMON pin. The VMON input pins along with the VMONGS ground sense
pins implement a differential pair for each voltage monitor to allow remote sense at the load. VMONGS lines must be connected and are
not to exceed -0.2V - +0.3V in reference to the GNDA pin.
6. Open-drain outputs require an external pull-up resistor to a supply.
7. VCCD and VCCA pins must be connected together on the circuit board.
8. GNDA and GNDD pins must be connected together on the circuit board.
9. The RESETb pin should only be used for cascading two or more ispPAC-POWR1220AT8 devices.
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ISPPAC-POWR1220AT8 arduino
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ispPAC-POWR1220AT8 Data Sheet
Timing for JTAG Operations
Symbol
tISPEN
tISPDIS
tHVDIS
tHVDIS
tCEN
tCDIS
tSU1
tH
tCKH
tCKL
fMAX
tCO
tPWV
tPWP
Parameter
Program enable delay time
Program disable delay time
High voltage discharge time, program
High voltage discharge time, erase
Falling edge of TCK to TDO active
Falling edge of TCK to TDO disable
Setup time
Hold time
TCK clock pulse width, high
TCK clock pulse width, low
Maximum TCK clock frequency
Falling edge of TCK to valid output
Verify pulse width
Programming pulse width
Conditions
Min.
10
30
30
200
5
10
20
20
30
20
Typ.
Max.
15
15
25
15
Figure 2. Erase (User Erase or Erase All) Timing Diagram
et4U.com
VIH
TMS
VIL
VIH
TCK
VIL
tSU1
tH
tCKH
tSU1
tGKL
tH
tSU1
tH
tSU1
tCKH
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State Update-IR
Run-Test/Idle (Erase)
Select-DR Scan
tH
tCKH
tSU1
tGKL
tH
tCKH
tSU1
tH
tCKH
tSU2
Specified by the Data Sheet
Run-Test/Idle (Discharge)
Units
µs
µs
µs
µs
ns
ns
ns
ns
ns
ns
MHz
ns
µs
ms
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Figure 3. Programming Timing Diagram
VIH
TMS
VIL
VIH
TCK
VI L
tSU1
tH
tCKH
tSU1
tCKL
tH
tPWP
tSU1
tH
tCKH
tSU1
tH
tCKH
tSU1
tCKL
tH
tCKH
State
Update-IR
Run-Test/Idle (Program)
Select-DR Scan
Update-IR
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