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5962R9580101VXC 데이터시트 PDF




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기능 Logic Gate
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5962R9580101VXC 데이터시트, 핀배열, 회로
www.DataSheet4U.com
REVISIONS
A Changes in accordance with NOR 5962-R124-98 - thl.
B Update boilerplate to MIL-PRF-38535 requirements. Editorial changes
throughout. – jak
98-06-12
04-05-07
Raymond L. Monnin
Thomas M. Hess
DataSheet4U.com
DataShee
REV
SHEET
REV
BBBBB
SHEET
15 16 17 18 19
REV STATUS
REV
OF SHEETS
SHEET
BBBBBBBBBBBBB B
1 2 3 4 5 6 7 8 9 10 11 12 13 14
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
PREPARED BY
Thanh V. Nguyen
CHECKED BY
Thanh V. Nguyen
APPROVED BY
Monica L. Poelking
DRAWING APPROVAL DATE
95-10-31
REVISION LEVEL
B
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
MICROCIRCUIT, DIGITAL, RADIATION
HARDENED, HIGH SPEED CMOS, HEX
INVERTER WITH OPEN DRAIN, MONOLITHIC
SILICON
SIZE
CAGE CODE
A 67268
5962-95801
SHEET
DataSheDeSt4CUC.cFoOmRM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF
19
5962-E128-04
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5962R9580101VXC pdf, 반도체, 판매, 대치품
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2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
et4U.com
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
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DataShee
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.1.1 Microcircuit die. For the requirements for microcircuit die, see appendix A to this document.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2
3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.
3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4.
3.2.6 Irradiation test connections. The irradiation test connections shall be as specified in table III herein.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
case operating temperature range.
STANDARD
MICROCIRCUIT DRAWING
DataSheet4U.com DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
DataSheet4 U .com
SIZE
A
REVISION LEVEL
B
5962-95801
SHEET
4

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5962R9580101VXC 전자부품, 판매, 대치품
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TABLE I. Electrical performance characteristics – Continued.
1/ Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I
herein. Output terminals not designated shall be high level logic, low level logic, or open, except for the ICC test, the output
terminals shall be open. When performing the ICC test, the current meter shall be placed in the circuit such that all current
flows through the meter.
2/ For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and
the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the minimum
and maximum limits, as applicable, listed herein.
3/ Devices supplied to this drawing meet all levels M, D, P, L, and R of irradiation. However, these devices are only tested at
the "R" level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post
irradiation electrical measurements for any RHA level, TA = +25°C.
4/ Force/measure functions may be interchanged.
5/ Power dissipation capacitance (CPD) determines both the power consumption (PD) and current consumption (IS). Where
PD = (CPD + CL) (VCC x VCC)f + (ICC x VCC)
IS = (CPD + CL) VCCf + ICC
f is the frequency of the input signal.
6/ The test vectors used to verify the truth table shall, at a minimum, test all functions of each input and output. All possible
input to output logic patterns per function shall be guaranteed, if not tested, to the truth table in figure 2 herein. For VOUT
measurements, L 0.5 V and H 4.0 V.
7/ AC limits at VCC = 5.5 V are equal to the limits at VCC = 4.5 V. For propagation delay tests, all paths must be tested.
8/ This parameter is guaranteed but not tested. This parameter is characterized upon initial design or process changes which
affect this characteristic.
et4U.com
Device types
All
Case outlines
C and X
Terminal numbDeartaSheet4U.comTerminal symbol
1 A1
2 Y1
3 A2
4 Y2
5 A3
6 Y3
7 GND
8 Y4
9 A4
10 Y5
11 A5
12 Y6
13 A6
14 VCC
DataShee
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DataSheet4U.com DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
DataSheet4 U .com
SIZE
A
REVISION LEVEL
B
5962-95801
SHEET
7

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5962R9580101VXC

Logic Gate

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