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PDF ADIS16204 Data sheet ( Hoja de datos )

Número de pieza ADIS16204
Descripción Programmable Dual Axis Digital Accelerometer and Impact Sensor
Fabricantes Analog Devices 
Logotipo Analog Devices Logotipo



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Preliminary Technical Data
Programmable Dual Axis Digital
Accelerometer and Impact Sensor
ADIS16204
FEATURES
Dual-axis impact sensing
Dual-axis acceleration sensing, +70g, +35g
14-bit resolution
17.1 mg/LSB, 8.55mg/LSB sensitivity
Impact peak-level sample and hold
Programmable Event Recorder
400Hz double-pole Bessel sensor response
12-bit digital temperature sensor output
Digitally controlled sensitivity and bias
Digitally controlled sample rate, up to 4096 SPS
Dual alarm settings with programmable threshold limits
Auxiliary digital I/O
Digitally activated self test
Digitally activated low power mode
SPI®-compatible serial interface
Auxiliary 12-bit ADC input and DAC output
Single-supply operation: 3.0 V to +3.6 V
3500 g powered shock survivability
APPLICATIONS
Impact detection
Condition monitoring
Safety Systems
Shock sensor
GENERAL DESCRIPTION
The ADIS16204 is a programmable impact sensor in a single
compact package enabled by the Analog Devices iSensor
integration. By enhancing the Analog Devices iMEMS® sensor
technology with an embedded signal processing solution, the
ADIS16204 provides tunable digital sensor data in a convenient
format that can be accessed using a serial peripheral interface
(SPI). The SPI interface provides access to measurements for
dual-axis linear acceleration, a root-sum-square (RSS) of both
axes, temperature, power supply, and one auxiliary analog
input. Easy access to digital sensor data provides developers
with a system-ready device, reducing development time, cost,
and program risk.
Unique characteristics of the end system are accommodated
easily through several built-in features, such as a single
command in-system offset calibration, along with convenient
sample rate control.
Rev. PrA
10/10/2006 4:24 AM
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
FUNCTIONAL BLOCK DIAGRAM
AUX AUX
ADC DAC VREF
Temperature
Sensor
Inertial
MEMS
Sensor
Self-Test
Signal
Conditioning
&
Conversion
Digital
Processing
Digital
Control
SPI
Port
VDD
COM
Power
Management
Alarms
Aux
I/O
RST
DIO0 DIO1
Figure 1.
CS
SCLK
DIN
DOUT
The ADIS16204 offers the following embedded features, which
eliminate the need for external circuitry and provide a simplified
system interface:
Peak sample and hold
Programmable Event Recording
Configurable trigger levels
Auxiliary 12-bit ADC and DAC
Configurable digital I/O port
Digital self-test function
The ADIS16204 offers two power management features for
managing system-level power dissipation: low power mode and
a configurable shutdown feature.
The ADIS16204 is available in a 9.2 mm × 9.2 mm × 3.9 mm
laminate-based land grid array (LGA) package with a
temperature range of −40°C to +105°C.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2006 Analog Devices, Inc. All rights reserved.
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ADIS16204 pdf
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Preliminary Technical Data
TIMING SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, tilt = 0°, unless otherwise noted.
Table 2.
Parameter
Description
fSCLK
tDATARATE
tDATARATE
tcs
tDAV
tDSU
tDHD
tDF
tDR
tSFS
Fast mode, SMPL_TIME ≤ 0x07 (fs ≥ 1024 Hz)
Normal mode, SMPL_TIME ≥ 0x08 (fs ≤ 910 Hz)
Chip select period, fast mode, SMPL_TIME ≤ 0x07 (fs ≥ 1024 Hz)
Chip select period, normal mode, SMPL_TIME ≥ 0x08 (fs ≤ 910 Hz)
Chip select to clock edge
Data output valid after SCLK edge
Data input setup time before SCLK rising edge
Data input hold time after SCLK rising edge
Data output fall time
Data output rise time
CS high after SCLK edge
1 Guaranteed by design, not tested.
Min1
0.01
0.01
40
100
48.8
24.4
48.8
5
TIMING DIAGRAMS
CS
SCLK
tDATA RATE
tSTALL
tSTALL = tDATA RATE – 16/fSCLK
Figure 2. SPI Chip Select Timing
ADIS16204
Typ Max Unit
2.5 MHz
1.0 MHz
μs
μs
ns
100 ns
ns
ns
5 12.5 ns min
5 12.5 ns min
ns typ
CS
SCLK
DOUT
DIN
tCS
1
MSB
W/R
23 4 56
tDAV
DB14
tDSU
DB13
DB12
tDHD
DB11
DB10
A5 A4 A3 A2
15 16
tSFS
DB2
DB1
LSB
D2 D1 LSB
Figure 3. SPI Timing
(Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)
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