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PDF ADM2486 Data sheet ( Hoja de datos )

Número de pieza ADM2486
Descripción Half-Duplex iCoupler Isolated RS-485 Transceiver
Fabricantes Analog Devices 
Logotipo Analog Devices Logotipo



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Data Sheet
High Speed, Half-Duplex iCoupler
Isolated RS-485 Transceiver
ADM2486
FEATURES
Half-duplex, isolated RS-485 transceiver
PROFIBUS® compliant
ANSI EIA/TIA 485-A and ISO 8482: 1987(E) compliant
20 Mbps data rate
5 V or 3 V operation (VDD1)
High common-mode transient immunity: >25 kV/μs
Isolated DE status output
Receiver open-circuit, fail-safe design
Thermal shutdown protection
50 nodes on bus
Safety and regulatory approvals
UL recognition—2500 Vrms for 1 minute per UL 1577
CSA Component Acceptance Notice #5A
IEC 609501 800 Vrms (basic), 400 Vrms (reinforced)
VDE Certificate of Conformity
DIN V VDE 0884-10 (VDE V 0884-10): 2006-12
VIORM = 560 V peak
Operating temperature range: −40°C to +85°C
Wide body, 16-lead SOIC package
APPLICATIONS
Isolated RS-485/RS-422 interfaces
PROFIBUS networks
Industrial field networks
Multipoint data transmission systems
GENERAL DESCRIPTION
The ADM2486 differential bus transceiver is an integrated,
galvanically isolated component designed for bidirectional
data communication on multipoint bus transmission lines. It
is designed for balanced transmission lines and complies with
ANSI EIA/TIA-485-A and ISO 8482: 1987(E).
The device employs Analog Devices iCoupler® technology to
combine a 3-channel isolator, a three-state differential line
driver, and a differential input receiver into a single package.
The logic side of the device is powered with either a 5 V or a
3 V supply, and the bus side uses an isolated 5 V supply.
FUNCTIONAL BLOCK DIAGRAM
VDD1
VDD2
ADM2486
RTS
DE
TxD
PV
RxD
RE
A
B
GND1
Figure 1.
GND2
The ADM2486 driver has an active-high enable feature. The
driver differential outputs and the receiver differential inputs
are connected internally to form a differential input/output port
that imposes minimal loading on the bus when the driver is
disabled or when VDD1 or VDD2 = 0 V. Also provided is an
active-high receiver disable feature that causes the receive
output to enter a high impedance state.
The device has current-limiting and thermal shutdown features
to protect against output short circuits and situations where bus
contention may cause excessive power dissipation. The part is
fully specified over the industrial temperature range and is
available in a 16-lead, wide body SOIC package.
Rev. E
Document Feedback
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700 ©2004–2013 Analog Devices, Inc. All rights reserved.
Technical Support
www.analog.com

1 page




ADM2486 pdf
ADM2486
Data Sheet
Parameter
Min Typ Max Unit Test Conditions/Comments
COMMON-MODE TRANSIENT IMMUNITY1
25
kV/µs VCM = 1 kV,
transient magnitude = 800 V
HIGH FREQUENCY, COMMON-MODE NOISE IMMUNITY
100
mV VHF = +5 V, −2 V < VTEST2 < +7 V,
1 MHz < fTEST < 50 MHz, see Figure 6
1 Common-mode transient immunity is the maximum common-mode voltage slew rate that can be sustained while maintaining specification-compliant operation.
VCM is the common-mode potential difference between the logic and bus sides. The transient magnitude is the range over which the common-mode is slewed. The
common-mode voltage slew rates apply to both rising and falling common-mode voltage edges.
Rev. E | Page 4 of 20

5 Page





ADM2486 arduino
ADM2486
TEST CIRCUITS
VOD
R
R VOC
Figure 3. Driver Voltage Measurement
375
VOD3 60
VTEST
375
Figure 4. Driver Voltage Measurement
RTS
DE
150
TxD
VDD2
A 195
RxD
B 110
RE
VDD1
GND1
VDD2 GND2
195
GND2
Figure 5. Supply-Current Measurement Test Circuit
RTS
DE
TxD
VCM(HF)
RxD
2.2k
GND2
RECEIVE
ENABLE
VDD1
GND1 VDD2
VDD2
195
B
A 110470nF
195
GND2
GND2
50
FTEST,
110nF VHF
50
22k
VTEST2
100nF
100nF
Figure 6. High Frequency Common-Mode Noise Test Circuit
Data Sheet
A CL1
RLDIFF
B CL2
Figure 7. Driver Propagation Delay
RTS
DE 150
50pF
TxD
RxD
RE
VDD1
GND1
A
B
VDD2 GND2
Figure 8. RTS-to-DE Propagation Delay
VCC
A
110
TxD S1
S2
B 50pF VOUT
RTS
Figure 9. Driver Enable/Disable
A
B RE
VOUT
CL
Figure 10. Receiver Propagation Delay
+1.5V
S1
–1.5V
RL
RE
CL VOUT
VCC
S2
RE IN
Figure 11. Receiver Enable/Disable
Rev. E | Page 10 of 20

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