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PDF MCZ33298 Data sheet ( Hoja de datos )
| Número de pieza | MCZ33298 | |
| Descripción | Eight Output Switch | |
| Fabricantes | Freescale Semiconductor | |
| Logotipo |  |
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Freescale Semiconductor
Technical Data
Eight Output Switch with Serial
Peripheral Interface I/O
Document Number: MC33298
Rev. 5.0, 10/2006
33298
The 33298 is a smart eight-output low-side power switch. It is a
versatile device incorporating an 8-bit serial-in shift register to control
an 8-bit parallel output latch providing control of eight independent
"ON/OFF" output switches. Applications include the control of
solenoids, relays, lamps, small DC-motors, and other moderate
current loads (1.0 – 3.0 A).
LOW-SIDE SWITCH
The 33298 interfaces directly with a microcontroller to control
various inductive or incandescent loads. Input control is fast. Data
rates are guaranteed to 2.0 MHz but the device is capable of rates to
8.5 MHz @ 25°C.
Each output uses high-efficiency MOSFET power transistors
configured with open drains. Each low "ON" resistance output (0.4 Ω
RDS(ON) @ 25°C) is capable of sinking up to 3.0 A of transient current.
On a continuous basis, each output can simultaneously (with all
outputs "ON") handle 0.5 A of current when the device is soldered onto
a typical PC board. Higher output currents are dependent on the
number of outputs simultaneously "ON". The circuit's innovative
monitoring and protection features include very low standby current.
DW SUFFIX
EG SUFFIX (PB-FREE)
98ASB42344B
24 SOICW
ORDERING INFORMATION
Device
Temperature
Range (TA)
Package
Features
• Designed to Operate Over Wide Supply Voltages of 5.5 to 26.5 V
• Interfaces to Microprocessor Using 8-Bit SPI I/O Protocol up to
MC33298DW/R2
MCZ33298EG/R2
-40°C to 125°C
3.0 MHz
• 1.0 A Peak Current Outputs with Maximum RDS(on) of 1.6 Ω
at TJ - 150°C
• Outputs Current Limited to Accommodate In-rush Currents Associated with Switching Incandescent Loads
• Output Voltages Clamped to 53 V During Inductive Switching
• Maximum Sleep Current (IPWR) of 25 µA
• Maximum of 4.0 mA IDD During Operation
• Pb-Free Packaging Designated by Suffix Code EG
24 SOIC
VDD
MCU
33298
VPWR OP 0
SFPD OP 1
VDD OP 2
CS
SCLK
SI
SO
RESET
OP 3
OP 4
OP 5
OP 6
OP 7
GND
V PWR
Figure 1. 33298 Simplified Application Diagram
Freescale Semiconductor, Inc. reserves the right to change the detail specifications, as
may be required, to permit improvements in the design of its products.
© Freescale Semiconductor, Inc., 2006. All rights reserved.
1 page  
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 3. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
Power Supply Voltage
Normal Operation (Steady-State)
Transient Conditions (1)
Logic Supply Voltage (2)
Input pin Voltage (3)
Output Clamp Voltage (4)
2.0 mA ≤ IOUT ≤ 0.5 A
VPWR(SS)
VPWR(PK)
VDD
VIN
VOUT(OFF)
- 1.5 to 26.5
- 13 to 60
- 0.3 to 7.0
- 0.3 to 7.0
50 to 75
V
V
V
V
Output Self-Limit Current
Continuous Per Output Current (5)
ESD Voltage (6)
Human Body Model (7)
Machine Model (7)
Output Clamp Energy (8)
Repetitive:
TJ = 25°C
TJ = 124°C
Non-Repetitive:
TJ = 25°C
TJ = 124°C
Recommended Frequency of SPI Operation (9)
Storage Temperature
Peak Package Reflow Temperature During Reflow (10), (11)
IOUT(LIM)
IOUT(CONT)
VESD1
VESD2
ECLAMP
fSPI
TSTG
TPPRT
3.0 to 6.0
1.0
2000
200
100
30
2.0
0.5
2.0
- 55 to 150
Note 11.
A
A
V
mJ
mJ
J
J
MHz
°C
°C
Notes
1. Transient capability with external 100 Ω resistor in series with VP pin and supply.
2. Exceeding these limits may cause a malfunction or permanent damage to the device.
3. Exceeding the limits on SCLK, SI, CS, SFPD, or RST pins may cause permanent damage to the device.
4. With output OFF.
5. Continuous output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient temperature
will require maximum output current computation using package RθJA.
6. ESD data available upon request.
7. ESD1 testing is performed in accordance with the Human Body Model (CZap = 200 pF, RZap = 1500 Ω), ESD2 testing is performed in
accordance with the Machine Model (CZap = 200pF, RZap = 0 Ω).
8. Maximum output clamp energy capability at 150°C junction temperature using a single non-repetitive pulse method.
9. Guaranteed and production tested for 2.0 MHz SPI operation, but demonstrated to operate to 8.5 MHz at 25°C.
10. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
11. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standerd J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL),
> Go to www.freescale.com
> Search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx)]
> Locate your Part Number and in the Details column, select “View”
> Select “Environmental and Compliance Information”
Analog Integrated Circuit Device Data
Freescale Semiconductor
33298
5
5 Page 
TIMING DIAGRAMS
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
RST
0.2 VDD
tw(RST)
CS
0.2 VDD
SCLK
tLEAD
0.7 VDD
tw(SCLKH)
0.2 VDD
SI Don't Care
tSI(su)
0.7 VDD
Valid
0.2 VDD
tR
tw(SCLKL)
tSI(hold)
Don't Care
tLAG
tF
Valid
Figure 4. Input Timing Switch Characteristics
ELECTRICAL PERFORMANCE CURVES
VIH
VIL
VIH
VIL
VIH
VIL
Don't Care
VIH
VIL
SCLK
VDD = 5.0 V
33298
Under
Test
SO
CL = 200 pF
VDD = 5.0 V
VPull-Up = 2.5 V
33298
CS Under
Test
RL = 1.0 kΩ
SO
CL = 20 pF
CL represents the total capacitance of the test fixture and probe.
Figure 5. Valid Data Delay Time and
Valid Time Test Circuit
L ρεπρεσεντσ τηε τοταλ χαπαχιτανχε οφ τηε τεστ φιξτυρε ανδ προβε
Figure 6. Enable and Disable Time Test Circuit
Analog Integrated Circuit Device Data
Freescale Semiconductor
33298
11
11 Page | ||
| Páginas | Total 28 Páginas | |
| PDF Descargar | [ Datasheet MCZ33298.PDF ] | |
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