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33989 PDF 데이터시트 ( Data , Function )

부품번호 33989 기능
기능 System Basis Chip
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33989 데이터시트, 핀배열, 회로
www.DFaretaeSshceeatl4eUS.ceommiconductor
Technical Data
System Basis Chip with
High-Speed CAN Transceiver
Document Number: MC33989
Rev. 13.0, 3/2007
33989
The 33989 is a monolithic integrated circuit combining many
functions used by microcontrollers (MCU) found in automotive
Engine Control Units (ECUs). The device incorporates
functions such as: two voltage regulators, four high voltage
(wake up) inputs, a 1Mbaud capable CAN physical interface,
an SPI interface to the MCU and VSUP monitoring and fault
detection circuitry. The 33989 also provides reset control in
conjunction with VSUP monitoring and the watchdog timer
features. Also, an Interrupt can be generated, for the MCU,
based on CAN bus activity as well as mode changes.
Features
• VDD1: Low Drop Voltage Regulator, Current Limitation,
Overtemperature Detection, Monitoring, and Reset Function
• VDD1: Total Current Capability 200 mA
• V2: Tracking Function of VDD1 Regulator. Control Circuitry for
External Bipolar Ballast Transistor for High Flexibility in Choice of
Peripheral Voltage and Current Supply
• Low Stand-By Current Consumption in Stop and Sleep Modes
• High-Speed 1 MBaud CAN Physical Interface
• Four External High Voltage Wake-up Inputs Associated with HS1
VBAT Switch
• 150 mA Output Current Capability for HS1 VBAT Switch Allowing
Drive of External Switches Pull-Up Resistors or Relays
• VSUP Failure Detection
• 40 V Maximum Transient Voltage
• Pb Free designated by suffix code EG
SYSTEM BASIS CHIP
WITH HIGH-SPEED CAN
DW SUFFIX
EG SUFFIX (PB-FREE)
98ASB42345B
28-PIN SOICW
ORDERING INFORMATION
Device
MC33989DW/R2
MCZ33989EG/R2
Temperature
Range (TA)
-40°C to 125°C
Package
28 SOICW
33989
VPWR
5.0 V
VDD1
VSUP
V2
MCU
GND
RST
INT
V2CTRL
V2
HS1
Local Module Supply
CS CS
SCLK SPI SCLK
MOSI
MOSI
MISO
MISO
L0
L1
L2
Wake-Up Inputs
L3
WD Safe Circuits
TX CANH
RX CANL
Twisted
CAN Bus
Pair
Figure 1. MC33989 Simplified Application Diagram
Freescale Semiconductor, Inc. reserves the right to change the detail specifications,
as may be required, to permit improvements in the design of its products.
© Freescale Semiconductor, Inc., 2007. All rights reserved.




33989 pdf, 반도체, 판매, 대치품
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage at VSUP
Continuous (Steady-State)
Transient Voltage (Load Dump)
Logic Signals (RX, TX, MOSI, MISO, CS, SCLK, RST, WD, and INT)
Output Current VDD1
VSUP
VSUP
VLOG
I
-0.3 to 27
-0.3 to 40
-0.3 to VDD1 + 0.3
Internally Limited
V
V
A
HS1
Voltage
Output Current
ESD Voltage, Human Body Model (1)
HS1, L0, L1, L2, L3
All Other Pins
V
I
VESDH
-0.3 to VSUP + 0.3
Internally Limited
- 4.0 to 4.0
-2.0 to 2.0
V
A
kV
ESD Voltage Machine Model
All Pins Except CANH and CANL
VESDM
±200
V
L0, L1, L2, L3
DC Input Voltage
DC Input Current
Transient Input Voltage with External Component (2)
VWUDC
-0.3 to 40
-2.0 to 2.0
-100 to 100
V
mA
V
CANL and CANH Continuous Voltage
CANL and CANH Continuous Current
CANH and CANL Transient Voltage (Load Dump) (4)
CANH and CANL Transient Voltage (5)
Logic Inputs (TX and RX)
VCANH/L
ICANH/L
VTRH/L
VTRH/L
V
-27 to 40
200
40
-40 to 40
-0.5 to 6.0
V
mA
V
V
V
ESD Voltage (HBM 100 pF, 1.5 k) CANL, CANH
ESD Voltage Machine Model
CANH and CANL
VESDCH
VESDCM
-4.0 to 4.0
-200 to 200
KV
V
Notes
1. ESD1 testing is performed in accordance with the Human Body Model (CZAP=100 pF, 1.5 k), the Machine Model (MM) (CZAP = 200 pF,
RZAP = 0 ), and the Charge Device Model (CDM), Robotic (CZAP = 4.0pF).
2. According to ISO 7637 specification. See Table 6, page 24.
3. Load Dump test according to ISO 7637 part 1.
4. Transient test according to ISO 7637 part 1, pulses 1, 2, 3a, and 3b according to schematic in Table 17, page 35.
33989
4
Analog Integrated Circuit Device Data
Freescale Semiconductor

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33989 전자부품, 판매, 대치품
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V VSUP 18 V, -40°C TA 125°C, GND = 0 V unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol Min Typ Max Unit
BATFAIL Flag Hysteresis (13)
Battery Fall Early Warning Threshold
In Normal and Standby Mode
VBF(HYS)
1.0
BFEW
5.3 5.8 6.3
V
V
Battery Fall Early Warning Hysteresis
In Normal and Standby Mode (13)
BFEWH
0.1 0.2 0.3
V
POWER OUTPUT (VDD1) (14)
VDD1 Output Voltage
VDD1OUT
IDD1 from 2.0 to 200 mA TAMB -40 to 125°C, 5.5 V < VSUP < 27 V
4.9 5.0 5.1
V
VDD1 Output Voltage
IDD1 from 2.0 to 200 mA, 4.5 V < VSUP < 5.5 V
VDD1OUT2
V
4.0 —
Dropout Voltage
IDD1 = 200 mA
VDD1DRP
0.2 0.5
V
Dropout Voltage, Limited Output Current
IDD1 = 50 mA, 4.5 V < VSUP
VDD1DRP2
0.1 0.25
V
IDD1 Output Current
Internally Limited
IDD1
mA
200 285 350
Junction Thermal Shutdown
Normal or Standby Modes
TSD °C
160 — 200
Junction Over Temperature Pre-Warning
VDDTEMP Bit Set
TPW
°C
125 — 160
Temperature Threshold Difference
Reset Threshold 1
Selectable by SPI. Default Value After Reset.
TSD - TPW
20
40
°C
RSTTH1
4.5 4.6 4.7
V
Reset Threshold 2
Selectable by SPI
RSTTH2
4.1 4.2 4.3
V
VDD1 Range for Reset Active
Reset Delay Time
Measured at 50% of Reset Signal
VDDR 1.0 — — V
tD — µs
4.0 30
Line Regulation (C at VDD1 = 47 µF Tantal)
9.0 V VSUP < 18, IDD = 10 mA
LR1
mV
5.0 25
Line Regulation (C at VDD1 = 47 µF Tantal)
5.5 < VSUP < 27 V, IDD = 10 mA
LR2 —
mV
10 25
Load Regulation (C at VDD1 = 47 µF Tantal)
1.0 mA < IIDD < 200 mA
LD mV
— 25 75
Thermal Stability
VSUP = 13.5 V, 1 = -100 mA Not Tested (15)
THERMS
mV
— 30 50
Notes
13. With CAN cell in Sleep-Disable state. If CAN cell is Sleep-Enabled for wake-up, an additional 60 µA must be added to specified value.
14. IDD1 is the total regulator output current. VDD specification with external capacitor. Stability requirement: C > 47 µF ESR < 1.3
(tantalum capacitor). In reset, normal request, normal and standby modes. Measure with C = 47 µF Tantalum.
15. Guaranteed by design; however, it is not production tested.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33989
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