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ARC241 PDF 데이터시트 : 부품 기능 및 핀배열

부품번호 ARC241
기능 (ARC241 / ARC242) Array chip resistors
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ARC241 데이터시트, 핀배열, 회로
Array chip resistors
size 4 × 0603
ARC241/ARC242
ARV241/ARV242
FEATURES
4 × 0603 sized resistors in one
1206-sized package
Reduced reel exchange time
Low assembly costs
Reduced PCB area
www.DataSheet4RUe.cdoumced size of final equipment
Higher component and equipment
reliability.
APPLICATIONS
Camcorders
Hand held measuring equipment
Car telephones
Computers
Portable radio, CD and cassette
players.
DESCRIPTION
The resistors are constructed on a
high grade ceramic body (aluminium
oxide). Internal metal electrodes are
added at each end and connected by
a resistive paste which is applied to
the top surface of the substrate. The
composition of the paste is adjusted
to give the approximate resistance
required and the value is trimmed to
within tolerance, by laser cutting of
this resistive layer.
The resistive layer is covered with a
protective coating and printed with the
resistance value. Finally, external end
terminations are added. For ease of
soldering the outer layer of these end
terminations is a lead-tin alloy.
handbook, 2 columns
R1 R2 R3 R4
CCA862
R1 = R2 = R3 = R4.
For dimensions see Fig.3 and Table 3.
Fig.1 Equivalent circuit diagram.
QUICK REFERENCE DATA
DESCRIPTION
Resistance range
Resistance tolerance and E-series
Temperature coefficient
Absolute maximum dissipation
per resistive element at Tamb = 70 °C
Maximum permissible voltage
Climatic category (IEC 60068)
Basic specification
ARC241 ARV241
±5%; E24 series
≤±200 × 106/K
VALUE
ARC242
10 to 1 M
±1%; E96 series
≤±100 × 106/K
ARV242
±1%; E24/E96 series
≤±200 × 106/K
0.063 W
50 V (DC or RMS)
55/155/56
IEC 60115-8
R-Array overview
TYPE
ARC241
ARC242
ARV241
ARV242
TERMINATION
TECHNOLOGY
concave
concave
convex
convex
SIZE
4 × 0603
4 × 0603
4 × 0603
4 × 0603
TOLERANCE
(%)
5
1
5
1
1




ARC241 pdf, 반도체, 판매, 대치품
TESTS AND REQUIREMENTS
Essentially all tests are carried out in accordance with the schedule of
“IEC publication 60 115-8”, category LCT/UCT/56 (rated temperature
range: Lower Category Temperature, Upper Category Temperature;
damp heat, long term, 56 days). The testing also covers the requirements
specified by EIA and EIAJ.
The tests are carried out in accordance with IEC publication 60 068,
“Recommended basic climatic and mechanical robustness testing
procedure for electronic components” and under standard atmospheric
conditions according to “IEC 60068-1”, subclause 5.3.
Unless otherwise specified the following values apply:
Temperature: 15 °C to 35 °C
Relative humidity: 25% to 75%
Air pressure: 86 kPa to 106 kPa (860 mbar to 1060 mbar).
In Table 4 the tests and requirements are listed with reference to the
relevant clauses of “IEC publications 60 115-8 and 60068”; a short
description of the test procedure is also given.
In some instances deviations from the IEC recommendations were
necessary for our method of specifying.
All soldering tests are performed with mildly activated flux.
Table 4 Test procedures and requirements
www.DataSheet4U.com IEC
60 115-8
CLAUSE
IEC
60 068-2
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS
ARC241 ARV241
ARC242
ARV242
Tests in accordance with the schedule of IEC publication 60115-8
4.4.1
visual examination
4.4.2
4.5
4.18
20 (Tb)
dimensions
(outline; see Fig.3)
resistance
resistance to
soldering heat
gauge (mm)
applied voltage (+0/10%):
10 Ω ≤ R < 100 : 0.3 V
100 Ω ≤ R < 1 k: 1 V
1 kΩ ≤ R < 10 k: 3 V
10 kΩ ≤ R < 100 k: 10 V
100 kΩ ≤ R < 1 M: 25 V
R 1 M: 50 V
unmounted chips; 10 ±1 s; 260 ±5 °C
4.29 45 (Xa) component solvent isopropyl alcohol or H2O followed by
resistance
brushing in accordance with “MIL 202 F”
4.17 20 (Ta) solderability
unmounted chips completely immersed for
2 ±0.5 s in a solder bath at 235 ±2 °C
no holes; clean surface;
no visible damage
see Table 3
R Rnom:
max. ±5%
R Rnom:
max. ±1%
R Rnom:
max. ±5%
no visible damage
R/R max.: ±(0.5% +0.05 )
no visible damage
R/R max.:
±(1% +0.05 )
good tinning (95% covered);
no visible damage

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ARC241

(ARC241 / ARC242) Array chip resistors

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(ARC241 / ARC242) Array chip resistors

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