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Número de pieza | NX3L1T5157 | |
Descripción | Low-ohmic single-pole double-throw switch | |
Fabricantes | NXP Semiconductors | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de NX3L1T5157 (archivo pdf) en la parte inferior de esta página. Total 19 Páginas | ||
No Preview Available ! NX3L1T5157
Low-ohmic single-pole double-throw switch
Rev. 01 — 16 September 2008
Product data sheet
www.datasheet4u.com
1. General description
The NX3L1T5157 provides one low-ohmic single-pole double-throw analog switch,
suitable for use as an analog or digital multiplexer/demultiplexer. It has a digital select
input (S) with Schmitt trigger action, two independent inputs/outputs (Y0, Y1) and a
common input/output (Z).
Schmitt trigger action at the select input (S) makes the circuit tolerant to slower input rise
and fall times across the entire VCC range from 1.4 V to 3.6 V.
A low input voltage threshold allows pin S to be driven by lower level logic signals without
a significant increase in supply current ICC. This makes it possible for the NX3L1T5157 to
switch 3.6 V signals with a 1.8 V digital controller, eliminating the need for logic level
translation.
The NX3L1T5157 allows signals with amplitude up to VCC to be transmitted from Z to Y0
or Y1, or from Y0 or Y1 to Z. Its low ON resistance (0.5 Ω) and flatness (0.13 Ω) ensures
minimal attenuation and distortion of transmitted signals.
2. Features
I Wide supply voltage range from 1.4 V to 3.6 V
I Very low ON resistance (peak):
N 1.6 Ω (typical) at VCC = 1.4 V
N 1.0 Ω (typical) at VCC = 1.65 V
N 0.55 Ω (typical) at VCC = 2.3 V
N 0.50 Ω (typical) at VCC = 2.7 V
I Break-before-make switching
I High noise immunity
I ESD protection:
N HBM JESD22-A114E Class 3A exceeds 7500 V
N MM JESD22-A115-A exceeds 200 V
N CDM AEC-Q100-011 revision B exceeds 1000 V
I CMOS low-power consumption
I Latch-up performance exceeds 100 mA per JESD 78 Class II Level A
I Direct interface with TTL levels at 3.0 V
I Control input accepts voltages above supply voltage
I Very low supply current, even when input is below VCC
I High current handling capability (350 mA continuous current under 3.3 V supply)
I Specified from −40 °C to +85 °C and from −40 °C to +125 °C
1 page NXP Semiconductors
NX3L1T5157
Low-ohmic single-pole double-throw switch
11. Static characteristics
www.datasheet4u.com
Table 7. Static characteristics
At recommended operating conditions; voltages are referenced to GND (ground 0 V).
Symbol Parameter Conditions
Tamb = 25 °C
Min Typ Max
VIH
VIL
II
IS(OFF)
IS(ON)
ICC
∆ICC
CI
CS(OFF)
CS(ON)
HIGH-level
input voltage
LOW-level
input voltage
input leakage
current
OFF-state
leakage
current
VCC = 1.4 V to 1.6 V
VCC = 1.65 V to 1.95 V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V
VCC = 1.4 V to 1.6 V
VCC = 1.65 V to 1.95 V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V
select input S;
VI = GND to 3.6 V;
VCC = 1.4 V to 3.6 V
Y0 and Y1 port;
VCC = 1.4 V to 3.6 V;
see Figure 4
ON-state
leakage
current
Z port;
VCC = 1.4 V to 3.6 V;
see Figure 5
supply current
additional
supply current
input
capacitance
VI = VCC or GND;
VCC = 3.6 V;
VSW = GND or VCC
VI = 2.6 V; VCC = 3.6 V;
VSW = GND or VCC
VI = 1.8 V; VCC = 3.6 V;
VSW = GND or VCC
VI = 1.8 V; VCC = 2.5 V;
VSW = GND or VCC
OFF-state
capacitance
ON-state
capacitance
0.9 -
-
0.9 -
-
1.1 -
-
1.3 -
-
- - 0.3
- - 0.4
- - 0.4
- - 0.5
---
- - ±5
- - ±5
- - 100
- 0.35 0.7
- 2.5 4
- 50 200
- 1.0 -
- 35 -
- 130 -
Tamb = −40 °C to +125 °C Unit
Min Max Max
(85 °C) (125 °C)
0.9 -
-V
0.9 -
-V
1.1 -
-V
1.3 -
-V
- 0.3 0.3 V
- 0.4 0.3 V
- 0.4 0.4 V
- 0.5 0.5 V
- ±0.5 ±1 µA
- ±50 ±500 nA
- ±50 ±500 nA
- 690 6000 nA
- 1 1 µA
- 5 5 µA
- 300 500 nA
- - - pF
- - - pF
- - - pF
NX3L1T5157_1
Product data sheet
Rev. 01 — 16 September 2008
© NXP B.V. 2008. All rights reserved.
5 of 19
5 Page NXP Semiconductors
NX3L1T5157
Low-ohmic single-pole double-throw switch
www.datasheet4u.com
a. Test circuit
G VI
GND
V VO RL
VCC
S Y0
Z Y1
CL
VEXT = 1.5 V
001aag571
VI 0.5VI
0.9VO
VO
tb-m
b. Input and output measurement points
Fig 14. Test circuit for measuring break-before-make timing
0.9VO
001aag572
VCC
S Y0 1
switch
Z Y1 2
G VI
GND
V VO
RL
CL
Test data is given in Table 11.
Definitions test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
VEXT = External voltage for measuring switching times.
Fig 15. Load circuit for switching times
VEXT = 1.5 V
001aag642
Table 11. Test data
Supply voltage
VCC
1.4 V to 3.6 V
Input
VI
VCC
tr, tf
≤ 2.5 ns
Load
CL
35 pF
NX3L1T5157_1
Product data sheet
Rev. 01 — 16 September 2008
RL
50 Ω
© NXP B.V. 2008. All rights reserved.
11 of 19
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