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PDF ADIS16060 Data sheet ( Hoja de datos )
| Número de pieza | ADIS16060 | |
| Descripción | Wide Bandwidth Yaw Rate Gyroscope | |
| Fabricantes | Analog Devices | |
| Logotipo |  |
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www.daFtaEsAhTeeUt4RuE.cSom
Complete angular rate digital gyroscope
14-bit resolution
Scalable measurement range
Initial range: ±80°/sec (typical)
Increase range with external resistor
Z-axis (yaw rate) response
SPI digital output interface
High vibration rejection over wide frequency
2000 g-powered shock survivability
1 kHz bandwidth
Selectable using external capacitor
Externally controlled self-test
Internal temperature sensor output
Dual auxiliary 14-bit ADC inputs
Absolute rate output for precision applications
5 V single-supply operation
8.2 mm × 8.2 mm × 5.2 mm package
−40°C to +105°C operation
RoHS compliant
APPLICATIONS
Platform stabilization
Image stabilization
Guidance and control
Inertia measurement units
Robotics
Wide Bandwidth
Yaw Rate Gyroscope with SPI
ADIS16060
GENERAL DESCRIPTION
The ADIS16060 is a yaw rate gyroscope with an integrated
serial peripheral interface (SPI). It features an externally
selectable bandwidth response and scalable dynamic range.
The SPI port provides access to the rate sensor, an internal
temperature sensor, and two external analog signals (using
internal ADC). The digital data available at the SPI port is
proportional to the angular rate about the axis that is normal
to the top surface of the package.
An additional output pin provides a precision voltage reference.
A digital self-test function electromechanically excites the sensor
to test the operation of the sensor and the signal-conditioning
circuits.
The ADIS16060 is available in an 8.2 mm × 8.2 mm × 5.2 mm,
16-terminal, peripheral land grid array (LGA) package.
FUNCTIONAL BLOCK DIAGRAM
FILT
RATE
VCC
RATE
SENSOR
ADIS16060
TEMPERATURE
SENSOR
MUX
14-BIT
ADC
DIGITAL
CONTROL
AIN1
AIN2
SCLK
DIN
DOUT
MSEL1
MSEL2
GND
Figure 1.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2008 Analog Devices, Inc. All rights reserved.
1 page  
ADIS16060
TIMING SPECIFICATIONS
TA = 25°C, angular rate = 0°/sec, unless otherwise noted.1
Table 2. Read/Output Sequence
Parameter
Figure Reference
Symbol
Min Typ Max Unit
www.daStearsihael Cetl4ouc.kcFormequency
2.9 MHz
Throughput Rate
See Figure 2
tCYC
100 kHz
MSEL1 Falling to SCLK Low
See Figure 2
tCSD
0 μs
MSEL1 Falling to SCLK Rising
See Figure 2
tSUCS
20
ns
SCLK Falling to Data Remains Valid
See Figure 2
tHDO 5 16
ns
MSEL1 Rising Edge to DOUT High Impedance
See Figure 2
tDIS
14 100 ns
SCLK Falling to Data Valid
See Figure 2
tEN
16 50
ns
Acquisition Time
See Figure 2
tACQ 400
ns
DOUT Fall Time
See Figure 2
tF
11 25
ns
DOUT Rise Time
See Figure 2
tR
11 25
ns
Data Setup Time
See Figure 3
t5 5 5
ns
SCLK Falling Edge to MSEL2 Rising Edge
See Figure 3
t7 0 0
ns
Data Hold Time
See Figure 3
t6 4.5
ns
1 Guaranteed by design. All input signals are specified with tR = tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 5 V operating range spans from
4.75 V to 5.25 V.
Timing Diagrams
MSEL1
tSUCS
tCYC
COMPLETE CYCLE
POWER DOWN
tACQ
SCLK
1
45
tCSD
tEN tHDO
tDIS
DOUT
HIGH-Z
0 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 0
HIGH-Z
(MSB)
NOTE:
A MINIMUM OF 20 CLOCK CYCLES ARE REQUIRED FOR 14-BIT CONVERSION.
(LSB)
Figure 2. Serial Interface Timing Diagram–Read/Output Sequence (CPOL = 0, CPHA = 0)
t7
MSEL2
SCLK
t5
t6
DIN DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
NOTE:
THE LAST EIGHT BITS CLOCKED IN ARE LATCHED WITH THE RISING EDGE OF THE MSEL2 LINE.
Figure 3. Serial interface Timing–Input/Configuration Sequence (CPOL = 0, CPHA = 1)
Rev. 0 | Page 5 of 12
5 Page 
APPLICATIONS INFORMATION
SUPPLY AND COMMON CONSIDERATIONS
Power supply noise and transient behaviors can influence the
accuracy and stability of any sensor-based measurement system.
www.daTtahsehAeeDt4ISu1.c6o0m60 provides 0.2 μF of decoupling capacitance on
the VCC pin. Depending on the level of noise present in the
power supply of the system, the ADIS16060 may not require
any additional decoupling capacitance for this supply.
SETTING BANDWIDTH
External Capacitor COUT is used in combination with the on-
chip ROUT resistor to create a low-pass filter to limit the
bandwidth of the ADIS16060 rate response. The –3 dB
frequency set by ROUT and COUT is
( )fOUT
=
1
2 × π × ROUT × COUT
and can be well controlled because ROUT has been trimmed
during manufacturing to be 200 kΩ ± 5%. Setting the range
with an external resistor impacts ROUT as follows:
(( ))ROUT
=
200 kΩ × REXT
200 kΩ + REXT
In general, an additional hardware or software filter is added to
attenuate high frequency noise arising from demodulation spikes
at the gyro’s 14 kHz resonant frequency. The noise spikes at 14 kHz
can be clearly seen in the power spectral density curve shown in
Figure 14.
INCREASING MEASUREMENT RANGE
Scaling the measurement range requires the addition of a single
resistor, connected across the RATE and FILT pins. The following
equation provides the proper relationship for selecting the
appropriate resistor:
200 kΩ
REXT = Δ −1
where Δ is the increase in range.
ADIS16060
1
0.1
0.01
0.001
0.0001
10
100 1k 10k
FREQUENCY (Hz)
100k
Figure 14. Noise Spectral Density with 2-Pole, Low-Pass Filter (40 Hz and 250 Hz)
DYNAMIC DIGITAL SENSITIVITY SCALING
This device supports in-system, dynamic, digital sensitivity scaling.
TEMPERATURE MEASUREMENTS
When using the temperature sensor, an acquisition time of
greater than 40 μs helps to ensure proper setting and measurement
accuracy. See Table 2 and Figure 2 for details on the definition
of acquisition time.
SELF-TEST FUNCTION
Exercising the self-test function is simple, as shown in this
example.
1. Configure using DIN = 00100010 (positive self-test,
rate selected).
2. Read output.
3. Configure using DIN = 00100000 (positive self-test off,
rate selected)
4. Read output.
5. Calculate the difference between Step 2 and Step 4, and
compare this with the specified self-test output changes in
the Specifications section.
Exercising the negative self-test requires changing the sequence
in Step 1 to DIN = 00100001.
Rev. 0 | Page 11 of 12
11 Page | ||
| Páginas | Total 12 Páginas | |
| PDF Descargar | [ Datasheet ADIS16060.PDF ] | |
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