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EDS2532CASG 데이터시트 PDF




Elpida Memory에서 제조한 전자 부품 EDS2532CASG은 전자 산업 및 응용 분야에서
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부품번호 EDS2532CASG 기능
기능 256M bits SDRAM
제조업체 Elpida Memory
로고 Elpida Memory 로고


EDS2532CASG 데이터시트 를 다운로드하여 반도체의 전기적 특성과 매개변수에 대해 알아보세요.



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EDS2532CASG 데이터시트, 핀배열, 회로
DATA SHEET
www.DataSheet4U.com
256M bits SDRAM
EDS2532CASG (8M words × 32 bits)
Specifications
Density: 256M bits
Organization
2M words × 32 bits × 4 banks
Package: 90-ball FBGA
Lead-free (RoHS compliant)
Power supply: VDD, VDDQ = 2.5V ± 0.2V
Clock frequency: 133MHz/100MHz (max.)
2KB page size
Row address: A0 to A11
Column address: A0 to A8
Four internal banks for concurrent operation
Interface: LVTTL
Burst lengths (BL): 1, 2, 4, 8, full page
Burst type (BT):
Sequential (1, 2, 4, 8, full page)
Interleave (1, 2, 4, 8)
/CAS Latency (CL): 2, 3
Precharge: auto precharge operation for each burst
access
Refresh: auto-refresh, self-refresh
Refresh cycles: 4096 cycles/64ms
Average refresh period: 15.6μs
Operating ambient temperature range
TA = 0°C to +70°C
Features
• ×32 organization
Single pulsed /RAS
Burst read/write operation and burst read/single write
operation capability
Byte control by DQM
Pin Configurations
/xxx indicates active low signal.
90-ball FBGA
1234567
A
DQ13 VSS VDD
B
DQ11 DQ15 VSSQ
C
DQ14 DQ12 VDDQ
D
DQ10 DQ9 VSSQ
E
DQ8 VDD VDDQ
F
VSS DQM1 VDD
G
CLK CKE A9
H
NC A8 A7
J
A6 A5 A4
K
A3 DQM3 VDD
L
VSS DQ31 VDDQ
M
DQ29 DQ30 VSSQ
N
DQ25 DQ27 VDDQ
P
DQ28 DQ24 VSSQ
R
DQ26 VSS VDD
VSS VDD DQ2
VDDQ DQ0 DQ4
VSSQ DQ1 DQ3
VDDQ DQ5 DQ6
VSSQ DQ7 VDD
VSS /WE DQM0
/CS /CAS /RAS
NC A11 BA0
BA1 A10 A0
A1 A2 DQM2
VSSQ DQ16 VSS
VDDQ DQ17 DQ18
VSSQ DQ22 DQ20
VDDQ DQ23 DQ19
VSS VDD DQ21
(Top view)
A0 to A11
BA0, BA1
DQ0 to DQ31
/CS
/RAS
/CAS
/WE
DQM0 to DQM3
CKE
CLK
VDD
VSS
VDDQ
VSSQ
NC
Address inputs
Bank select address
Data-input/output
Chip select
Row address strobe
Column address strobe
Write enable
DQ mask enable
Clock enable
Clock input
Power for internal circuit
Ground for internal circuit
Power for DQ circuit
Ground for DQ circuit
No connection
Document No. E0541E21 (Ver. 2.1)
Date Published February 2006 (K) Japan
Printed in Japan
URL: http://www.elpida.com
This product became EOL in March, 2007.
©Elpida Memory, Inc. 2004-2006




EDS2532CASG pdf, 반도체, 판매, 대치품
EDS2532CASG
www.DataSheet4U.com
Electrical Specifications
All voltages are referenced to VSS (GND).
After power up, execute power up sequence and initialization sequence before proper device operation is achieved
(refer to the Power up sequence).
Absolute Maximum Ratings
Parameter
Symbol
Rating
Unit Note
Voltage on any pin relative to VSS
Supply voltage relative to VSS
Short circuit output current
Power dissipation
Operating temperature
Storage temperature
VT
VDD
IOS
PD
TA
Tstg
–0.5 to +3.6
–0.5 to +3.6
50
1.0
0 to +70
–55 to +125
V
V
mA
W
°C
°C
Caution
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended DC Operating Conditions (TA = 0 to +70°C)
Parameter
Symbol
min.
max.
Supply voltage
VDD, VDDQ
2.3
2.7
VSS, VSSQ
0
0
Input high voltage
VIH 1.7
VDD + 0.3
Input low voltage
VIL –0.3
0.7
Notes: 1. The supply voltage with all VDD and VDDQ pins must be on the same level.
2. The supply voltage with all VSS and VSSQ pins must be on the same level.
3. VIH (max.) = VDD + 1.5V (pulse width 5ns).
4. VIL (min.) = VSS – 1.5V (pulse width 5ns).
Unit
V
V
V
V
Notes
1
2
3
4
Data Sheet E0541E21 (Ver. 2.1)
4

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EDS2532CASG 전자부품, 판매, 대치품
EDS2532CASG
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AC Characteristics (TA = 0 to +70°C, VDD, VDDQ = 2.5V ± 0.2V, VSS, VSSQ = 0V)
-75 -1A
Parameter
Symbol
min.
max.
min.
max.
Unit
System clock cycle time
(CL = 2)
tCK
10
10
ns
(CL = 3)
tCK 7.5 — 10 — ns
CLK high pulse width
tCH 2.5 —
3
— ns
CLK low pulse width
tCL 2.5 — 3
— ns
Access time from CLK
tAC —
5.4 —
6
ns
Data-out hold time
tOH 2.0 —
2.0 —
ns
CLK to Data-out low impedance tLZ
0
—0
— ns
CLK to Data-out high impedance tHZ
5.4 —
6
ns
Input setup time
tSI
1.5 —
2
— ns
Input hold time
tHI
0.8 —
1
— ns
Ref/Active to Ref/Active
command period
tRC
67.5 —
70
ns
Active to Precharge command
period
tRAS
45
120000
50
120000
ns
Active command to column
command (same bank)
tRCD
20
20
ns
Precharge to active command
period
tRP
20
20
ns
Write recovery or data-in to
precharge lead time
tDPL
15
20
ns
Last data into active latency
tDAL
2CLK + 20ns —
2CLK + 20ns —
Active (a) to Active (b) command
period
tRRD
15
20
ns
Transition time (rise and fall)
tT
0.5 5.0 0.5 5
ns
Refresh period
(4096 refresh cycles)
tREF
64
64
ms
Notes: 1. AC measurement assumes tT = 0.5ns. Reference level for timing of input signals is 1.2V.
2. Access time is measured at 1.2V. Load condition is CL = 30pF.
3. tLZ (min.) defines the time at which the outputs achieves the low impedance state.
4. tHZ (max.) defines the time at which the outputs achieves the high impedance state.
Notes
1
1
1
1
1, 2
1, 2
1, 2, 3
1, 4
1
1
1
1
1
1
1
1
Data Sheet E0541E21 (Ver. 2.1)
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부품번호상세설명 및 기능제조사
EDS2532CASG

256M bits SDRAM

Elpida Memory
Elpida Memory

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