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Número de pieza | HCTS86D | |
Descripción | Radiation Hardened Quad 2-Input Exclusive OR Gate | |
Fabricantes | Intersil Corporation | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de HCTS86D (archivo pdf) en la parte inferior de esta página. Total 9 Páginas | ||
No Preview Available ! HCTS86MS
October 1995
Radiation Hardened
Quad 2-Input Exclusive OR Gate
Features
Pinouts
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day
(Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
14 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T14, LEAD FINISH C
TOP VIEW
A1 1
B1 2
Y1 3
A2 4
B2 5
Y2 6
GND 7
14 VCC
13 B4
12 A4
11 Y4
10 B3
9 A3
8 Y3
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCTS86MS is a Radiation Hardened Quad 2-Input
Exclusive OR Gate. A high on any one input exclusively will
change the output to a High state.
The HCTS86MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of radia-
tion hardened, high-speed, CMOS/SOS Logic Family.
The HCTS86MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE
(FLATPACK) MIL-STD-1835 CDFP3-F14, LEAD FINISH C
TOP VIEW
A1
B1
Y1
A2
B2
Y2
GND
1 14
2 13
3 12
4 11
5 10
69
78
VCC
B4
A4
Y4
B3
A3
Y3
Functional Diagram
An
(1, 4, 9, 12)
Bn
(2, 5, 10, 13)
Yn
(3, 6, 8, 11)
PART
NUMBER
TEMPERATURE SCREENING
RANGE
LEVEL
PACKAGE
HCTS86DMSR -55oC to +125oC Intersil Class 14 Lead SBDIP
S Equivalent
HCTS86KMSR -55oC to +125oC Intersil Class 14 Lead Ceramic
S Equivalent Flatpack
HCTS86D/
Sample
+25oC
Sample
14 Lead SBDIP
HCTS86K/
Sample
+25oC
Sample
14 Lead Ceramic
Flatpack
HCTS86HMSR
+25oC
Die
Die
TRUTH TABLE
INPUTS
OUTPUTS
An Bn Yn
LLL
L HH
HLH
HH L
NOTE: L = Logic Level Low, H = Logic level High
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
1
Spec Number 518623
File Number 2249.2
1 page Specifications HCTS86MS
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
3, 6, 8, 11
1, 2, 4, 5, 7, 9, 10,
12, 13
-
14 - -
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3, 6, 8, 11
7
-
1, 2, 4, 5, 9, 10, 12,
-
13, 14
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
7
3, 6, 8, 11
14
1, 2, 4, 5, 9, 10,
-
12, 13
NOTES:
1. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
3, 6, 8, 11 7 1, 2, 4, 5, 9, 10, 12, 13, 14
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518623
5
5 Page |
Páginas | Total 9 Páginas | |
PDF Descargar | [ Datasheet HCTS86D.PDF ] |
Número de pieza | Descripción | Fabricantes |
HCTS86D | Radiation Hardened Quad 2-Input Exclusive OR Gate | Intersil Corporation |
HCTS86DMSR | Radiation Hardened Quad 2-Input Exclusive OR Gate | Intersil Corporation |
HCTS86HMSR | Radiation Hardened Quad 2-Input Exclusive OR Gate | Intersil Corporation |
HCTS86K | Radiation Hardened Quad 2-Input Exclusive OR Gate | Intersil Corporation |
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