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PDF GAL20LV8 Data sheet ( Hoja de datos )

Número de pieza GAL20LV8
Descripción Low Voltage E2CMOS PLD Generic Array Logic
Fabricantes Lattice Semiconductor 
Logotipo Lattice Semiconductor Logotipo



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No Preview Available ! GAL20LV8 Hoja de datos, Descripción, Manual

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GAL20LV8
Low Voltage E2CMOS PLD
Generic Array Logic™
Features
Functional Block Diagram
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— 3.5 ns Maximum Propagation Delay
— Fmax = 250 MHz
— 2.5 ns Maximum from Clock Input to Data Output
— UltraMOS® Advanced CMOS Technology
— TTL-Compatible Balanced 8mA Output Drive
• 3.3V LOW VOLTAGE 20V8 ARCHITECTURE
— JEDEC-Compatible 3.3V Interface Standard
— 5V Compatible Inputs
• ACTIVE PULL-UPS ON ALL PINS
• E2 CELL TECHNOLOGY
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Yields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
• EIGHT OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
— Programmable Output Polarity
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS
— 100% Functional Testability
• APPLICATIONS INCLUDE:
— Glue Logic for 3.3V Systems
— DMA Control
— State Machine Control
— High Speed Graphics Processing
— Standard Logic Speed Upgrade
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
Description
The GAL20LV8D, at 3.5 ns maximum propagation delay time,
provides the highest speed performance available in the PLD
market. The GAL20LV8D is manufactured using Lattice
Semiconductor's advanced 3.3V E2CMOS process, which com-
bines CMOS with Electrically Erasable (E2) floating gate technology.
High speed erase times (<100ms) allow the devices to be repro-
grammed quickly and efficiently.
The generic architecture provides maximum design flexibility by
allowing the Output Logic Macrocell (OLMC) to be configured by
the user. An important subset of the many architecture configura-
tions possible with the GAL20LV8D are the PAL architectures listed
in the table of the macrocell description section. GAL20LV8D
devices are capable of emulating any of these PAL architectures
with full function/fuse map compatibility.
Unique test circuitry and reprogrammable cells allow complete AC,
DC, and functional testing during manufacture. As a result, Lattice
Semiconductor delivers 100% field programmability and function-
ality of all GAL products. In addition, 100 erase/write cycles and
data retention in excess of 20 years are specified.
I/CLK
I
I
I
I
I
I
I
I
I
I
IMUX
CLK
8 OLMC
8 OLMC
8 OLMC
8 OLMC
8 OLMC
8 OLMC
8 OLMC
8 OLMC
OE
IMUX
Pin Configuration
PLCC
4
I5
I
I7
NC
I9
I
I 11
12
2 28
GAL20LV8D
Top View
14 16
26
25 I/O/Q
I/O/Q
23 I/O/Q
NC
21 I/O/Q
I/O/Q
19 I/O/Q
18
I
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I
I/OE
Copyright © 2000 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
March 2000
20lv8_05
1

1 page




GAL20LV8 pdf
Specifications GAL20LV8
Registered Mode Logic Diagram
PLCC Package Pinout
2
2640
0 4 8 12 16 20 24 28 32 36 P T D
3
0000
0280
4
0320
0600
5
0640
0920
6
0960
1240
7
1280
1560
9
1600
1880
10
1920
2200
11
2240
2520
12
13
2703
64-USER ELECTRONIC SIGNATURE FUSES
2568, 2569, ....
.... 2630, 2631
Byte7 Byte6 ....
.... Byte1 Byte0
MSB
LSB
OLMC
XOR-2560
AC1-2632
OLMC
XOR-2561
AC1-2633
27
26
25
OLMC
XOR-2562
AC1-2634
OLMC
XOR-2563
AC1-2635
OLMC
XOR-2564
AC1-2636
24
23
21
OLMC
XOR-2565
AC1-2637
OLMC
XOR-2566
AC1-2638
OLMC
XOR-2567
AC1-2639
20
19
18
17
OE
16
SYN-2704
AC0-2705
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GAL20LV8 arduino
Specifications GAL20LV8
AC Switching Characteristics
Over Recommended Operating Conditions
TEST
PARAMETER COND1.
DESCRIPTION
tpd2 A Input or I/O to Combinational Output
tco2 A Clock to Output Delay
tcf3 — Clock to Feedback Delay
tsu — Setup Time, Input or Feedback before Clock
th — Hold Time, Input or Feedback after Clock
A Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
COM
COM
COM
-3 -5 -7
UNITS
MIN. MAX. MIN. MAX. MIN. MAX.
1 3.5 1 5 1 7.5 ns
1 2.5 1 3 1 5 ns
— 2 — 2 — 3 ns
3 — 4 — 5 — ns
0 — 0 — 0 — ns
180 — 142.8 — 100 — MHz
fmax4
A Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
200 — 166 — 125 — MHz
A Maximum Clock Frequency with
No Feedback
250 — 166 — 125 — MHz
twh4
twl4
ten
— Clock Pulse Duration, High
— Clock Pulse Duration, Low
B Input or I/O to Output Enabled
B OE to Output Enabled
2 — 3 — 4 — ns
2 — 3 — 4 — ns
— 4.5 — 6
— 3.5 — 5
— 7.5 ns
— 6.5 ns
tdis C Input or I/O to Output Disabled
C OE to Output Disabled
— 4.5 — 6
— 3.5 — 5
— 7.5 ns
— 6.5 ns
1) Refer to Switching Test Conditions section.
2) Minimum values for tpd and tco are not 100% tested but established by characterization.
3) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
4) Refer to fmax Descriptions section. Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
CI
CI/O
PARAMETER
Input Capacitance
I/O Capacitance
TYPICAL
5
5
UNITS
pF
pF
TEST CONDITIONS
VCC = 3.3V, VI = 0V
VCC = 3.3V, VI/O = 0V
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