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PDF ELD-406SYGWA-S530-E2 Data sheet ( Hoja de datos )
| Número de pieza | ELD-406SYGWA-S530-E2 | |
| Descripción | Dual Digit Displays | |
| Fabricantes | Everlight Electronics | |
| Logotipo |  |
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Hay una vista previa y un enlace de descarga de ELD-406SYGWA-S530-E2 (archivo pdf) en la parte inferior de esta página. Total 6 Páginas | ||
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EVERLIGHT ELECTRONICS CO.,LTD.
Technical Data Sheet
0.4" Dual Digit Displays
█ Features :
● Industrial standard size.
● Low power consumption.
● Categorized for luminous intensity.
● Pb free
● The product itself will remain within RoHS
compliant version
█ Descriptions :
● The ELD-406 series is a large 10.16 mm
(0.4")high seven segment display
designed for viewing distances up to
7 meters.
● These displays provide excellent
reliability in bright ambient light.
● These devices are made with white
segments and gray surface.
█ Applications :
● Audio equipment
● Instrument panels
● Digital read out display
ELD-406SYGWA/S530-E2
PART NO.
ELD-406SYGWA/S530-E2
Material
AlGaInP
Chip
Emitted Color
Super Yellow Green
CG0508049 61064336
EVERLIGHT ELECTRONICS CO.,LTD. http : //www.everlight.com
Device Number : CDDD-406-071
Prepared date:2005/08/23
Rev. : 1
Page: 1 of 6
Prepared by: YanLi Zhong
1 page  
EVERLIGHT ELECTRONICS CO.,LTD.
Technical Data Sheet
0.4" Dual Digit Displays
ELD-406SYGWA/S530-E2
█ Reliability test items and conditions:
The reliability of products shall be satisfied with items listed below.
Confidence level：97%
LTPD：3%
NO Item
Test Conditions
Test
Hours/Cycle
Sample Size
Failure
Judgment
Criteria
Ac/Re
1 Solder Heat
TEMP : 260℃ ± 5 ℃
5 SEC
76 PCS
0/1
2 Temperature Cycle
3 Thermal Shock
4 High Temperature Storage
5 Low Temperature Storage
H : +85℃ 30min
∫ 5 min
L : -55℃ 30min
H : +100℃ 5min
∫ 10 sec
L : -10℃ 5min
TEMP : 100℃
TEMP : -55℃
50 CYCLE 76 PCS
0/1
50 CYCLE
1000 HRS
1000 HRS
76 PCS
76 PCS
76 PCS
Iv≦Ivt*0.5
or
Vf≧U
or
Vf≦L
0/1
0/1
0/1
6 DC Operating Life
IF = 10 mA
1000 HRS
7
High Temperature / High
Humidity
85℃/85% RH
1000 HRS
Note： Ivt：The test Iv value of the chip before the reliablility test
Iv：The test value of the chip that has completed the reliablility test
U：Upper Specification Limit
L： Lower Specification Limit
76 PCS
76 PCS
0/1
0/1
EVERLIGHT ELECTRONICS CO.,LTD. http : //www.everlight.com
Device Number : CDDD-406-071
Prepared date:2005/08/23
Rev. : 1
Page: 5 of 6
Prepared by: YanLi Zhong
5 Page | ||
| Páginas | Total 6 Páginas | |
| PDF Descargar | [ Datasheet ELD-406SYGWA-S530-E2.PDF ] | |
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