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부품번호 | NUP1301U 기능 |
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기능 | Ultra low capacitance ESD protection array | ||
제조업체 | NXP Semiconductors | ||
로고 | |||
전체 14 페이지수
NUP1301U
Ultra low capacitance ESD protection array
Rev. 1 — 28 January 2011
Product data sheet
1. Product profile
1.1 General description
Ultra low capacitance ElectroStatic Discharge (ESD) protection array in a small
SOT323 (SC-70) Surface-Mounted Device (SMD) plastic package designed to
protect one signal line in rail-to-rail configuration from the damage caused by
ESD and other transients.
1.2 Features and benefits
ESD protection of one signal line (rail-to-rail configuration)
Ultra low diode capacitance: Cd = 0.6 pF
ESD protection up to 30 kV
IEC 61000-4-2; level 4 (ESD)
IEC 61000-4-5 (surge); IPP = 11 A
AEC-Q101 qualified
1.3 Applications
Telecommunication networks
Video line protection
Microcontroller protection
I2C-bus protection
Antenna power supply
Analog audio
Class-D amplifier
1.4 Quick reference data
Table 1. Quick reference data
Tamb = 25 C unless otherwise specified.
Symbol Parameter
Conditions
Per diode
VRRM
repetitive peak reverse
voltage
Cd
diode capacitance
f = 1 MHz;
VR = 0 V
IR
reverse current
VR = 80 V
Min Typ Max Unit
- - 80 V
- 0.6 0.75 pF
- - 100 nA
NXP Semiconductors
NUP1301U
Ultra low capacitance ESD protection array
120
IPP
(%)
80
40
100 % IPP; 8 μs
001aaa630
e−t
50 % IPP; 20 μs
0
0 10 20 30 40
t (μs)
Fig 1. 8/20 s pulse waveform according to
IEC 61000-4-5
6. Thermal characteristics
IPP
100 %
90 %
001aaa631
10 %
tr = 0.7 ns to 1 ns
30 ns
60 ns
Fig 2. ESD pulse waveform according to
IEC 61000-4-2
t
Table 8. Thermal characteristics
Symbol Parameter
Per device
Rth(j-a)
thermal resistance from
junction to ambient
Rth(j-sp)
thermal resistance from
junction to solder point
Conditions
Min Typ Max
in free air
[1][2] -
-
625
- - 300
[1] Single diode loaded.
[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
Unit
K/W
K/W
NUP1301U
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 28 January 2011
© NXP B.V. 2011. All rights reserved.
4 of 14
4페이지 NXP Semiconductors
NUP1301U
Ultra low capacitance ESD protection array
ESD TESTER
acc. to IEC 61000-4-2
CZ = 150 pF; RZ = 330 Ω
RZ
CZ
450 Ω
RG 223/U
50 Ω coax
DUT
(DEVICE
UNDER
TEST)
10×
ATTENUATOR
4 GHz DIGITAL
OSCILLOSCOPE
50 Ω
vertical scale = 10 A/div
horizontal scale = 15 ns/div
vertical scale = 10 V/div
horizontal scale = 15 ns/div
GND
GND
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
GND
vertical scale = 10 A/div
horizontal scale = 15 ns/div
clamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network), pin 3 to 1 and 2
vertical scale = 10 V/div
horizontal scale = 15 ns/div
GND
unclamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network)
Fig 7. ESD clamping test setup and waveforms
clamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network), pin 3 to 1 and 2
006aab567
NUP1301U
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 28 January 2011
© NXP B.V. 2011. All rights reserved.
7 of 14
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부품번호 | 상세설명 및 기능 | 제조사 |
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DataSheet.kr | 2020 | 연락처 | 링크모음 | 검색 | 사이트맵 |